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Autor:
Pauline J. Kolbeck, Mihir Dass, Irina V. Martynenko, Relinde J.A. van Dijk-Moes, Kelly J.H. Brouwer, Alfons van Blaaderen, Willem Vanderlinden, Tim Liedl, Jan Lipfert
Atomic force microscopy (AFM) is a powerful technique for imaging molecules, macromolecular complexes, and nanoparticles with nanometer-resolution. However, AFM images are distorted by the shape of the tip used. These distortions can be corrected if
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78a6fe567678e43675fab7e1ad47afd5
https://doi.org/10.1101/2022.11.11.516090
https://doi.org/10.1101/2022.11.11.516090
