Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Reinhold Gartner"'
Publikováno v:
2021 43rd Annual EOS/ESD Symposium (EOS/ESD).
In this paper, different non-powered hand tools such as tweezers, pliers, or screwdrivers are assessed with respect to their ESD risk. The ESD properties of the tools are evaluated using resistance measurements and discharge current measurements betw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7097497c949753162b2395e7b7ac8fcc
https://doi.org/10.23919/eos/esd52038.2021.9574760
https://doi.org/10.23919/eos/esd52038.2021.9574760
Autor:
Richard Wong, Friedrich zur Nieden, Reinhold Gartner, Pasi Tamminen, Rita Fung, Toni Viheriakoski
Publikováno v:
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
ESD sensitive devices inside protective packaging may be exposed to high stress levels outside ESD protected area. ESD shielding bags are therefore tested with realistic stress levels by a system level ESD generator. The aim of this study is to estim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92db62b6bf018a64609afa78bb6b77b4
https://doi.org/10.23919/eos/esd.2019.8869964
https://doi.org/10.23919/eos/esd.2019.8869964
Autor:
Jurgen Speicher, Josef Niemesheim, Reinhold Gartner, Magdalena Hilkersberger, Wolfgang Stadler
Publikováno v:
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
Personnel handling ESD sensitive items in seated position are supposed to be grounded via a wrist strap. The paper describes measurement techniques to assess whether grounding personnel via ESD flooring and chair is feasible. Different techniques to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ead2dfe32fc04042860a2a6cab101856
https://doi.org/10.23919/eos/esd.2019.8869977
https://doi.org/10.23919/eos/esd.2019.8869977
Publikováno v:
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
ESD risk scenarios of conductive containers were assessed by using a system level test generator and different configurations of discharge electrodes. Energy coupling inside the container can be minimized by an applicable mechanical design. Avoidance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7d5931448a8a3376d866b4e7a3fb413
https://doi.org/10.23919/eos/esd.2018.8509696
https://doi.org/10.23919/eos/esd.2018.8509696
Autor:
Richard Wong, Reinhold Gartner, Jeremy Smallwood, Rita Fung, Toni Viheriakoski, Pasi Tamminen
Publikováno v:
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Clam shells can provide better ESD protection than shielding bags. Energy coupling in a near field is generally reduced by preventing a direct connection, decreasing capacitive coupling, and increasing breakdown field strength. A properly qualified s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::444e29146dd9c518c7a654b5d5fc859f
https://doi.org/10.23919/eos/esd.2018.8509697
https://doi.org/10.23919/eos/esd.2018.8509697
Autor:
Reinhold Gartner
Publikováno v:
Neutrality Austria ISBN: 9781351308847
Neutrality Austria
Neutrality Austria
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b5aad89bf484c0e50823d30af58f4abc
https://doi.org/10.4324/9781351308847-22
https://doi.org/10.4324/9781351308847-22
Publikováno v:
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
ESD control items are generally characterized by direct current measurements at certain voltage levels. Discharge resistance may, however, have a remarkable voltage and frequency dependency. We have assessed conductive polymers by comparing the resis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::795106ded0956d5d96b59634bf5a480c
https://doi.org/10.23919/eosesd.2017.8073442
https://doi.org/10.23919/eosesd.2017.8073442
Autor:
Reinhold Gartner, K. T. Kaschani
Publikováno v:
Microelectronics Reliability. 54:2410-2416
Common misconceptions regarding electrical overstress (EOS) and the failure characteristics of integrated circuits (ICs) are summarized, analyzed and clarified. In order to avoid EOS fails right from the beginning of the IC design process, a methodol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc7f09f304a4e1dc1df4ce38b42a069f
https://doi.org/10.1016/j.microrel.2014.04.007
https://doi.org/10.1016/j.microrel.2014.04.007
Publikováno v:
2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
The introduction of the CDM Joint Standard has an impact on the electrical properties of the tester hardware due to updated waveform requirements. Models of different CDM discharge heads are generated using measurement data in frequency domain. Disch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e315076ed6f67d365e037650cb14728
https://doi.org/10.1109/eosesd.2016.7592542
https://doi.org/10.1109/eosesd.2016.7592542
Publikováno v:
Microelectronics Reliability. 49:1079-1085
Integrated circuits (ICs) are qualified for their electrostatic discharge (ESD) robustness according to the well-known IC ESD standards Human Body Model, Machine Model, and Charged Device Model in order to guarantee safe handling in ESD protected are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc57456dc5ef9755fac39acdeb49db00
https://doi.org/10.1016/j.microrel.2009.07.029
https://doi.org/10.1016/j.microrel.2009.07.029