Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Reihl, R. F."'
Publikováno v:
Journal of Applied Physics; Jun1981, Vol. 52 Issue 6, p4027-4032, 6p
Publikováno v:
Journal of Materials Science; February 1989, Vol. 24 Issue: 2 p505-509, 5p
Publikováno v:
Applied Physics Letters; 1983, Vol. 42 Issue 7, p575-577, 3p
Publikováno v:
Applied Physics Letters; 1981, Vol. 39 Issue 9, p752-754, 3p
Autor:
LAWRENCE A. CASPER, D. E. Passoja, A. J. Scharman, Dieter K. Schroder, Robert G. Mazur, Rodney A. Young, Ronald V. Kalin, G. A. Rozgonyi, D. K. Sadana, Mary Ryan-Hotchkiss, Paul A. Lindfors, Ronald W. Kee, Douglas L. Jones, William F. Stickle, Kenneth D. Bomben, R. G. Downing, J. T. Maki, R. F. Fleming, Allan Rosencwaig, D. E. Aspnes, Aslan Baghdadi, Fran Adar, D. C. Reynolds, W. H. Penzel, B. Shushan, E. S. K. Quan, A. Boorn, D. J. Douglas, G. Rosenblatt, Richard M. Lindstrom, Fredric D. Leipziger, Richard J. Guidoboni, Jana Houskova, Kim-Khanh N. Ho, Marjorie K. Balazs, Vineet S. Dharmadhikari, Satish K. Gupta, Roland L. Chin, D. Scott Becker, William R. Schmidt, Charlie A. Peterson, Don C. Burkman, C. E. Nowakowski, J. V. Martinez de Pinillos, J. N. Ramsey
Autor:
J. S. Williams, J. M. Poate
Ion Implantation and Beam Processing covers the scientific and technological advances in the fields of ion implantation and beam processing. The book discusses the amorphization and crystallization of semiconductors; the application of the Boltzmann
Autor:
Arthur J. Ahearn
Trace Analysis by Mass Spectrometry deals with trace analysis of solids and liquids by mass spectrometric techniques. Topics include the physics and techniques of electrical discharge ion sources, transmission of ions through double focusing mass spe