Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Reed A. Schmell"'
Autor:
Trudy Tuttle-Hart, C. K. Carniglia, Andreas Saxer, Jean-Pierre Borgogno, Gerard Albrand, B. Lazarides, Emile Pelletier, Jean M. Bennett, T. H. Allen, Karl H. Guenther, Reed A. Schmell
Publikováno v:
Applied optics. 28(16)
Fourteen university, government, and industrial laboratories prepared a total of twenty pairs of single-layer titanium dioxide films. Several laboratories analyzed the coatings to determine their optical properties, thickness, surface roughness, abso
Autor:
Daniel A. Klinglesmith, Rodney A. Schmell, Jeff Lewis, Reed A. Schmell, Darren Gartner, Anthony Jaramillo, Kelly Romero, Colby A. Jurgenson, Andres Rael, K. McCord, E. J. Bakker
Publikováno v:
SPIE Proceedings.
We report on the design, application, and testing of custom protected silver and aluminum coatings for use on the Magdalena Ridge Observatory Interferometers (MROI) unit telescopes. The coatings were designed by Optical Surface Technologies (OST), an
Autor:
Anthony Jaramillo, Rodney A. Schmell, Andres Rael, Reed A. Schmell, Darren Gartner, A. Olivares, Jeff Lewis, E. J. Bakker, Kelly Romero
Publikováno v:
SPIE Proceedings.
We present the verification procedure for the 1.4 meter primary mirrors of the Magdalena Ridge Observatory Interferometer (MROI). Six mirrors are in mass production at Optical Surface Technologies (OST) in Albuquerque. The six identical parabolic mir
Autor:
Michelle Creech-Eakman, Colby A. Jurgenson, John Young, Reed A. Schmell, Christopher A. Haniff, Anthony Jaramillo, David F. Buscher, Erica Block
Publikováno v:
SPIE Proceedings.
This report focuses on the design, application, and testing of custom beamsplitter and anti-reflection coatings for use in the Magdalena Ridge Observatory Interferometer (MROI) beam combiners. The coatings were designed in collaboration with Optical
Publikováno v:
SPIE Proceedings.
Total internal reflection microscopy (TIRM) is an inspection method that yields an image of the defects in a surface and/or a dielectric thin film. By installing a TIRM system in a vacuum-deposition chamber, the formation of thin-film defects (visibl