Zobrazeno 1 - 10
of 115
pro vyhledávání: '"Redundant array of independent memory"'
Autor:
Anthony Saporito, Jesse Surprise, Mark Cichanowski, Brian Deskin, Parashurama Pradeep Bhadravati, Gregory J. Fredeman, John Isakson, Preetham M. Lobo, Ramon Bertran, Brian Bell, Brandon Bruen, Alper Buyuktosunoglu, Chris Cavitt, Ashutosh Mishra, Ofer Geva, Tobias Webel, Adam R. Jatkowski, Dina Hamid, David H. Wolpert, Dureseti Chidambarrao, Christopher J. Berry
Publikováno v:
ISSCC
The latest IBM Z microprocessor in the z15 system has been redesigned to have improved performance, system capacity and security over the previous z14 system [1]. These achievements are made while maintaining the central processor (CP) and system con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5098d5d3586a1bb77402a43349912352
https://doi.org/10.1109/isscc19947.2020.9063030
https://doi.org/10.1109/isscc19947.2020.9063030
Publikováno v:
IEEE Design & Test. 34:84-93
Editor’s note: Following technology scaling, runtime failure has emerged as one of the major challenges in modern VLSI designs under the increased parametric variability and low supply voltage. This issue is especially severe in nanoscale memory du
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f55b55d5333d1a17835297bbc439677
https://doi.org/10.1109/mdat.2016.2615844
https://doi.org/10.1109/mdat.2016.2615844
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36:1580-1591
Due to the emergence of extremely high density memory along with the growing number of embedded memories, memory yield is an important issue. Memory self-repair using redundancies to increase the yield of memories is widely used. Because high density
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::889b05434457456ec694a66a7ec82930
https://doi.org/10.1109/tcad.2017.2682639
https://doi.org/10.1109/tcad.2017.2682639
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25:2411-2418
The diminishing returns provided by voltage scaling have led to a recent paradigm shift toward so-called “approximate computing,” where computation accuracy is traded off for cost in error-tolerant applications. In this paper, a novel approach to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed5cfe24c73518d44147c9641bf07bd3
https://doi.org/10.1109/tvlsi.2017.2712613
https://doi.org/10.1109/tvlsi.2017.2712613
Publikováno v:
IEEE Transactions on Reliability. 65:1783-1797
With scaling technology, emerging nonvolatile devices, and data-intensive applications, memory faults have become a major reliability concern for computing systems. With various hardware and software approaches proposed to address this issue, a compr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94ae799152ee74017506909c8ea91738
https://doi.org/10.1109/tr.2016.2608357
https://doi.org/10.1109/tr.2016.2608357
Autor:
Mattan Erez, Dong Wan Kim
Publikováno v:
ISCA
Memory system reliability is a serious concern in many systems today, and is becoming more worrisome as technology scales and system size grows. Stronger fault tolerance capability is therefore desirable, but often comes at high cost. In this paper,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b66a7c165986a4cdd7e2bc38c65554db
https://doi.org/10.1145/3007787.3001205
https://doi.org/10.1145/3007787.3001205
Publikováno v:
IEEE Transactions on Consumer Electronics. 62:17-22
Solid State Drive (SSD) for the consumer market may not require extreme high performance, but it does want high density at a low cost. Redundant Array of Inexpensive (or Independent) Disks (RAID) are built up by a group of independent disk drives, no
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f5952826d5927e2f5b085a846051483a
https://doi.org/10.1109/tce.2016.7448558
https://doi.org/10.1109/tce.2016.7448558
Publikováno v:
ACM Transactions on Architecture and Code Optimization. 12:1-24
Stacked memory modules are likely to be tightly integrated with the processor. It is vital that these memory modules operate reliably, as memory failure can require the replacement of the entire socket. To make matters worse, stacked memory designs a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aee6a7b287fc7786c009e0b3bc753267
https://doi.org/10.1145/2840807
https://doi.org/10.1145/2840807
Autor:
Jose L. Neves, Ofer Geva, Anthony Saporito, Mark Cichanowski, Christopher J. Berry, Christian Jacobi, John Badar, Brian Bell, Christian Zoellin, L. Sigal, B. Huott, James D. Warnock, Richard F. Rizzolo, Jesse Surprise, S. Carey, Frank Malgioglio, Arthur J. O'Neill, Guenter Mayer, Robert J. Sonnelitter, John Isakson, Dina Hamid, Michael G. Wood, Ricardo H. Nigaglioni, David Wolpert, Dureseti Chidambarrao
Publikováno v:
ISSCC
The IBM Z microprocessor in the z14 system has been redesigned to improve performance, system capacity, and security [1] over the previous z13 system [2]. The system contains up to 24 central processor (CP) and 4 system controller (SC) chips. Each CP
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3fc78d2a0a09b0b28c2104fc9ef5268
https://doi.org/10.1109/isscc.2018.8310171
https://doi.org/10.1109/isscc.2018.8310171
Publikováno v:
Genetic Programming and Evolvable Machines. 17:83-117
Genome memory is an important aspect of electronic cells. Here, a novel genome memory structure called partial-DNA cyclic memory is proposed, in which cells only store a portion of the system's entire DNA. The stored gene number is independent of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8fb97c4dd740c311d3d2551df33078e
https://doi.org/10.1007/s10710-015-9248-2
https://doi.org/10.1007/s10710-015-9248-2