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pro vyhledávání: '"Redquest, Christopher"'
Autor:
Scharf, Jonathan, Chouchane, Mehdi, Finegan, Donal P., Lu, Bingyu, Redquest, Christopher, Kim, Min-cheol, Yao, Weiliang, Franco, Alejandro A., Gostovic, Dan, Liu, Zhao, Riccio, Mark, Zelenka, František, Doux, Jean-Marie, Meng, Ying Shirley
X-ray Computed Tomography (X-ray CT) is a well-known non-destructive imaging technique where contrast originates from the materials' absorption coefficients. Novel battery characterization studies on increasingly challenging samples have been enabled
Externí odkaz:
http://arxiv.org/abs/2107.07459
Autor:
Scharf, Jonathan, Yin, Lu, Redquest, Christopher, Liu, Ruixiao, Quinn, Xueying L., Ortega, Jeff, Wei, Xia, Wang, Joseph, Doux, Jean-Marie, Meng, Ying Shirley
To meet growing energy demands, degradation mechanisms of energy storage devices must be better understood. As a non-destructive tool, X-ray Computed Tomography (CT) has been increasingly used by the battery community to perform $\textit{in-situ}$ ex
Externí odkaz:
http://arxiv.org/abs/2105.03411
Autor:
Yin, Lu, Scharf, Jonathan, Ma, Jessica, Doux, Jean-Marie, Redquest, Christopher, Le, Viet, Yijie, Yin, Ortega, Jeff, Wei, Xia, Wang, Joseph, Meng, Ying Shirley
The rise of flexible electronics calls for cost-effective and scalable batteries with good mechanical and electrochemical performance. In this work, we developed printable, polymer-based AgO-Zn batteries that feature flexibility, rechargeability, hig
Externí odkaz:
http://arxiv.org/abs/2009.00207
Autor:
Yin, Lu, Scharf, Jonathan, Ma, Jessica, Doux, Jean-Marie, Redquest, Christopher, Le, Viet L., Yin, Yijie, Ortega, Jeff, Wei, Xia, Wang, Joseph, Meng, Ying Shirley
Publikováno v:
In Joule 20 January 2021 5(1):228-248
Akademický článek
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Autor:
Scharf, Jonathan, Yin, Lu, Redquest, Christopher, Liu, Ruixiao, Quinn, Xueying L, Ortega, Jeff, Wei, Xia, Wang, Joseph, Doux, Jean-Marie, Meng, Ying Shirley
Publikováno v:
ADVANCED ENERGY MATERIALS, vol 11, iss 33
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______325::7388765933af9c165d3a58575b5caf60
https://escholarship.org/uc/item/76b0k8k2
https://escholarship.org/uc/item/76b0k8k2