Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Rebekah Austin"'
Publikováno v:
Journal of Small Business and Enterprise Development. 29:1089-1107
PurposeLoan officer decisions are of particular importance to entrepreneurial firms which rely heavily on debt financing as a primary source of capital. The authors investigate whether social purpose in these firms impact loan officer response to the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c461fc5e9c0009579ce9570f1aa3592
https://doi.org/10.1108/jsbed-04-2022-0205
https://doi.org/10.1108/jsbed-04-2022-0205
Autor:
Kenneth A. LaBel, Hak Kim, Rebekah Austin, Raymond L. Ladbury, Michael J. Campola, Edward P. Wilcox, Jonathan A. Pellish
Publikováno v:
IEEE Transactions on Nuclear Science. 68:1002-1007
Analog single-event transient (SET) results are analyzed for two different applications within one system architecture. Application-specific analyses are presented on the MAX4595 commercial device using single-event effects criticality and goal struc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2db8ee4c73a7e49f25d4e69117ce246
https://doi.org/10.1109/tns.2021.3059174
https://doi.org/10.1109/tns.2021.3059174
Autor:
John W. Evans, Ronald D. Schrimpf, Ryan Alles, Rebekah Austin, Arthur F. Witulski, Gabor Karsai, Kaitlyn L. Ryder, Nagabhushan Mahadevan, Michael J. Campola
Publikováno v:
Facta universitatis - series: Electronics and Energetics. 34:1-20
We present an overview of the Systems Engineering and Assurance Modeling (SEAM) platform, a web-browser-based tool which is designed to help engineers evaluate the radiation vulnerabilities and develop an assurance approach for electronic parts in sp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::523ee498e9218dcdb61f43650f34ebbd
https://doi.org/10.2298/fuee2101001r
https://doi.org/10.2298/fuee2101001r
Autor:
Dennis R. Ball, Ronald D. Schrimpf, Kenneth F. Galloway, Brian D. Sierawski, Robert A. Reed, Arthur F. Witulski, Rebekah Austin
Publikováno v:
IEEE Transactions on Nuclear Science. 67:353-357
Variability of the solar energetic particle environment is investigated for single-event burnout (SEB) reliability of silicon carbide power metal-oxide-semiconductor field-effect transistors. A probabilistic assessment of failure evaluates the benefi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::572ead97eee88508fb8b2e9d9842e881
https://doi.org/10.1109/tns.2019.2957979
https://doi.org/10.1109/tns.2019.2957979
The Small Satellite (CubeSat) Program as a Pedagogical Framework for the Undergraduate EE Curriculum
Autor:
W. Timothy Holman, Brian Sierawski, Robert Reed, Robert Weller, Andrew Sternberg, Rebekah Austin, Daniel Fleetwood
Publikováno v:
2014 ASEE Annual Conference & Exposition Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c72b8a7f7722f9af60680ccee8cae51e
https://doi.org/10.18260/1-2--23178
https://doi.org/10.18260/1-2--23178
Autor:
Robert A. Reed, Jonathan Pellish, Peter J. Majewicz, Arthur F. Witulski, Nag Mahadevan, Gabor Karsai, Brian D. Sierawski, Ronald D. Schrimpf, John J. Evans, Michael J. Campola, Rebekah Austin
Publikováno v:
2020 IEEE Aerospace Conference.
This work describes one step towards automating the development of assurance cases for systems in radiation environments. The Systems Engineering Assurance and Modeling Platform (SEAM) developed by Vanderbilt and NASA is extended to automatically cro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::482fb858eb831a1d1e21ade6c3b2244c
https://doi.org/10.1109/aero47225.2020.9172762
https://doi.org/10.1109/aero47225.2020.9172762
Autor:
Arthur F. Witulski, Robert A. Reed, Ronald D. Schrimpf, Nagabhushan Mahadevan, Brian D. Sierawski, Gabor Karsai, Rebekah Austin
Publikováno v:
2020 Annual Reliability and Maintainability Symposium (RAMS).
The space environment raises several unique reliability issues for non-optical-based electronic systems for surviving radiation from cosmic rays, our Sun, or the trapped radiation belts. These radiation categories are total ionizing dose (TID), a cum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46881ef42a9c9138671a6e127c047379
https://doi.org/10.1109/rams48030.2020.9153630
https://doi.org/10.1109/rams48030.2020.9153630
Autor:
D. Reed, Kevin M. Warren, James M. Trippe, Robert A. Weller, Lloyd W. Massengill, Balaji Narasimham, Rebekah Austin, Ronald D. Schrimpf, Robert A. Reed, Brian D. Sierawski, B. Bartz
Publikováno v:
IEEE Transactions on Nuclear Science. 65:712-718
Muon-induced single-event upset cross sections are estimated for a 28-nm static random access memory (SRAM) using Monte Carlo simulations informed by ion test results. As an exercise in modeling with limited information, details of the 28-nm SRAM’s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f484b5668561f7df0adc44c7c436f0f
https://doi.org/10.1109/tns.2017.2786585
https://doi.org/10.1109/tns.2017.2786585
Autor:
Anthony Monteiro, Rebekah Austin, Jonathan C. Brandenburg, W. Burns Fisher, Robert Davis, Michael W. McCurdy, Kevin M. Warren, Robert A. Weller, James M. Trippe, Michael L. Alles, Robert A. Reed, Ronald D. Schrimpf, Lloyd W. Massengill, Gerald W. Buxton, Daniel M. Fleetwood, Brian D. Sierawski, Andrew L. Sternberg
Publikováno v:
IEEE Transactions on Nuclear Science. 64:293-300
New mechanisms of radiation sensitivity, such as low-energy proton SEU, potentially hinder the ability to define part-level failure rates and perform worst-case analysis. Ground-based radiation testing demonstrates sensitivity and is useful for under
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55638d0473c0b2f5fcf1e8817f89d180
https://doi.org/10.1109/tns.2016.2632440
https://doi.org/10.1109/tns.2016.2632440
Autor:
B. Bartz, Robert A. Weller, M. P. King, Stephanie L. Weeden-Wright, Erik D. Funkhouser, J. Labello, Robert Baumann, J. Nichols, Ronald D. Schrimpf, James M. Trippe, Brian D. Sierawski, Robert A. Reed, Balaji Narasimham, Rebekah Austin
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2709-2716
In this study, we present experimental evidence of single electron-induced upsets in commercial 28 nm and 45 nm CMOS SRAMs from a monoenergetic electron beam. Upsets were observed in both technology nodes when the SRAM was operated in a low power sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::515394b36a024f5457ef1ac2b8180c96
https://doi.org/10.1109/tns.2015.2496967
https://doi.org/10.1109/tns.2015.2496967