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Publikováno v:
Microscopy and Microanalysis. 7:234-235
The IBM high resolution STEM project has now reached the point where integration of new subsystems into the instrument is the main activity. During the past three years, we have demonstrated a 50meV EELS resolution using a high brightness electron mo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18e97034c1c4817f22445dc45582be4a
https://doi.org/10.1017/s1431927600027240
https://doi.org/10.1017/s1431927600027240
