Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Razan Aboljadayel"'
Autor:
Gleb Cheglakov, Oliver J. Burton, Stephan Hofmann, Adrian M. Ionescu, Razan Aboljadayel, Crispin H. W. Barnes
Publikováno v:
Nanomaterials
Nanomaterials, Vol 11, Iss 1598, p 1598 (2021)
Volume 11
Issue 6
Nanomaterials, Vol 11, Iss 1598, p 1598 (2021)
Volume 11
Issue 6
We report the growth, structural and magnetic properties of the less studied Eu-oxide phase, Eu$_3$O$_4$, thin films grown on a Si/SiO$_2$ substrate and Si/SiO$_2$/graphene using molecular beam epitaxy. The X-ray diffraction scans show that highly-te
Autor:
Joerg Wunderlich, Jairo Sinova, Henning Sirringhaus, Razan Aboljadayel, Mark Little, Riccardo Di Pietro, Daniel P.G.H. Wong, Shu-Jen Wang, S. Mueller, Mohammad Reza Mahani, Adam Marks, Angela Wittmann, Sam Schott, Remington Carey, Erik R. McNellis, Piotr Skalski, Cameron Jellett, Thomas Wagner, Iain McCulloch, Deepak Venkateshvaran, Uday Chopra, Adrian M. Ionescu, Guillaume Schweicher, Sergei A. Egorov, Ian E. Jacobs, Keehoon Kang, M. Cubukcu, Olga Zadvorna, Janis N.M. Siebrecht
Publikováno v:
Nature electronics. 2
Carbon-based semiconductors such as conjugated organic polymers are of potential use in the development of spintronic devices and spin-based information processing. In particular, these materials offer a low spin–orbit coupling strength due to thei
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::575d6a0d73000728e68b628b86a123ba
http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/318082
http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/318082
Autor:
Sam Schott, Cameron Jellett, Mark P. Little, Joerg Wunderlich, S. Mueller, Mohammad Reza Mahani, Daniel P.G.H. Wong, Shu-Jen Wang, Remington Carey, Olga Zadvorna, Adam Marks, Iain McCulloch, Janis N.M. Siebrecht, Thomas Wagner, Keehoon Kang, Jairo Sinova, M. Cubukcu, Henning Sirringhaus, Uday Chopra, Adrian M. Ionescu, Razan Aboljadayel, Sergei A. Egorov, Angela Wittmann, Guillaume Schweicher, Riccardo Di Pietro, Piotr Skalski, Deepak Venkateshvaran, Erik R. McNellis, Ian E. Jacobs
Publikováno v:
Nature Electronics. 2:313-313
Owing to a technical error, the ‘Published online’ date of this Article originally mistakenly appeared as ‘15 March 2019’, but should have been ‘18 March 2019’.
Publikováno v:
Solid State Communications. 152:220-224
We systematically studied the anomalous Hall effect in a series of polycrystalline Ni films with thickness ranging from 4 to 200 nm. It is found that both the longitudinal and anomalous Hall resistivity increased greatly as film thickness decreased.
Autor:
Bei Zhang, Qiang Zhang, Zaibing Guo, Razan Aboljadayel, Xixiang Zhang, Wenbo Mi, Aurelien Manchon, Priscila Barba
Publikováno v:
Physical Review B. 86
In this paper, we report the results of surface and interface scattering on anomalous Hall effect in Co/Pd multilayers with perpendicular magnetic anisotropy. The surface scattering effect has been extracted from the total anomalous Hall effect. By s