Zobrazeno 1 - 10 of 32 pro vyhledávání: '"Raymond P. Goehner"'
1
Microdiffraction phase identification in the scanning electron microscope (SEM)
Autor: Raymond P. Goehner, J. R. Michael
Publikováno v: Powder Diffraction. 19:100-103
The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the develo
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ec8ff3164197b044c6682396287b308b
https://doi.org/10.1154/1.1757450
Zobrazit plný text záznamu
2
A Study of Grazing Incidence Configurations and Their Effect on X-Ray Diffraction Data
Autor: Michael O. Eatough, Raymond P. Goehner
Publikováno v: Powder Diffraction. 7:2-5
In recent years, grazing incidence angle attachments have been shown to be very useful in the phase identification of thin polycrystalline films. These devices are sold commercially as attachments to standard powder diffractometers. The attachment no
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::51ad50a7c287bdb2b582e2cc42c619b1
https://doi.org/10.1017/s0885715600015980
Zobrazit plný text záznamu
3
Diffraction Peaks in X-Ray Spectroscopy: Friend or Foe?
Autor: Raymond P. Goehner, Ralph G. Tissot
Publikováno v: Advances in X-ray Analysis. 36:89-96
Diffraction peaks can occur as unidentifiable peaks in the energy spectrum of an x-ray spectrometric analysis. Recently, there has been increased interest in oriented thin polycrystalline films and epitaxial films on single crystal substrates for ele
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e5b44b5639694beda598a8fe2dca69a7
https://doi.org/10.1154/s0376030800018681
Zobrazit plný text záznamu
4
Characterization of PZT Thin Films Crystallographic Phases
Autor: Michael O. Eatough, Raymond P. Goehner, Thomas J. Headley, Bruce A. Tuttle
Publikováno v: Advances in X-ray Analysis. 35:159-167
The use of grazing incidence parallel beam x-ray diffraction (GIXRD) in the characterization of lead zirconate titanate (PZT) films is described. This tool has enabled us to depth profile the films. The transmission electron microscopy (TEM) results
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9d71da55058b4d26896eed2609ab38b4
https://doi.org/10.1154/s037603080000879x
Zobrazit plný text záznamu
5
Characterization of Ferroelectric PZT Thin Films - Line Broadening Study (Using Grazing Incidence Geometry)
Autor: Raymond P. Goehner, Michael O. Eatough, Thomas J. Headley, Bruce A. Tuttle
Publikováno v: Advances in X-ray Analysis. 35:601-605
Ferroelectric polycrystalline thin films are being pursued as materials for use in the next generation of radiation hardened nonvolatile semiconductor memories, optical switches and optical computers. Of particular interest are PZT films with a compo
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2eab2bde9dfe66c395b0639732b7d616
https://doi.org/10.1154/s0376030800009307
Zobrazit plný text záznamu
10
Electron Backscatter Diffraction In The Sem: Is Electron Diffraction In The Tem Obsolete?
Autor: Joseph R. Michael, M. E. Schlienger, Raymond P. Goehner
Publikováno v: Microscopy and Microanalysis. 3:879-880
The technique of electron backscatter diffraction (EBSD) in the scanning electron microscope is currently finding a large number of important applications in materials science. The patterns formed through EBSD were first studied over 40 years ago. It
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::faf02d444df8572bbc2a5505bacbcf59
https://doi.org/10.1017/s1431927600011284
Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání

Omezení vyhledávání
Plný text Recenzováno Digitální knihovna AV ČR
Zdroje