Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Raymond G. Greene"'
Publikováno v:
SID Symposium Digest of Technical Papers. 50:1481-1484
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::831ba721e5889b21dff8288b7d874fcc
https://doi.org/10.1002/sdtp.13221
https://doi.org/10.1002/sdtp.13221
Autor:
Bin Zhu, Michael Thompson, David M. Lynch, Kate E. Roach, Raymond G. Greene, Chen-Yang Chung, Dieter G. Ast
Publikováno v:
ECS Journal of Solid State Science and Technology. 5:P368-P375
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f1b3b059b5c90eb76b8f39513f44e9e
https://doi.org/10.1149/2.0361606jss
https://doi.org/10.1149/2.0361606jss
Publikováno v:
SID Symposium Digest of Technical Papers. 48:475-477
Substrate stress state determines the light leakage (LL) from dark state VA and IPS liquid crystal (LC) curved panels. Membrane stress creates VA but not IPS LL. Shear and bending stress create IPS but not VA LL. This result enables mitigation, desig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f91abd934b4ade1599156c321c7b3bba
https://doi.org/10.1002/sdtp.11655
https://doi.org/10.1002/sdtp.11655
Autor:
Dieter G. Ast, Bin Zhu, David A. Muller, David M. Lynch, Raymond G. Greene, Michael Thompson, Barnaby D.A. Levin
Publikováno v:
SID Symposium Digest of Technical Papers. 46:308-311
Crystallinity and texture of c-axis aligned crystal indium gallium zinc oxide (CAAC IGZO) films deposited by RF reactive sputtering were studied and characterized over a range of deposition conditions. The characteristic CAAC (009) peak at 2θ=30° w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a64a4cf0d71a3251e882735a2db27dcd
https://doi.org/10.1002/sdtp.10479
https://doi.org/10.1002/sdtp.10479
Publikováno v:
SID Symposium Digest of Technical Papers. 46:677-680
The influence of deposition parameters on the properties of RF sputter deposited c-axis aligned crystalline (CAAC) IGZO was evaluated using both single parameter and design of experiment (DOE) analysis. Deposition temperature and oxygen partial press
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::094a31a7a1ec0c410e341a995170dbac
https://doi.org/10.1002/sdtp.10262
https://doi.org/10.1002/sdtp.10262
Autor:
Adam James Ellison, Tomohiro Ishikawa, B-K Wang, Steven S. Rosenblum, Dmitri Vladislavovich Kuksenkov, Raymond G. Greene
Publikováno v:
SID Symposium Digest of Technical Papers. 47:1098-1100
Coring Iris™ Glass is a new high transmission glass for LCD back lighting applications. This paper reviews its mechanical and optical properties, contrasts them with polymeric materials currently in use, and demonstrates its benefit in ultra-slim L
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90823ce10e3757411e9646c34ad543fa
https://doi.org/10.1002/sdtp.10774
https://doi.org/10.1002/sdtp.10774
Publikováno v:
SID Symposium Digest of Technical Papers. 46:634-636
Curving flat substrates creates retardance proportional to the square of the thickness, approximately three times the typical max value of flat substrates. These stress patterns have distinctive interactions with dark state VA and IPS LC modes. Curve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::993f63a9158669d283b849fe7fc9d07e
https://doi.org/10.1002/sdtp.10230
https://doi.org/10.1002/sdtp.10230
Publikováno v:
ECS Journal of Solid State Science and Technology. 4:Q43-Q45
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::473c4f2de66589701eee70b7e49f918a
https://doi.org/10.1149/2.0261505jss
https://doi.org/10.1149/2.0261505jss
Publikováno v:
SID Symposium Digest of Technical Papers. 44:1163-1166
The direct mechanical touching usually generates mura on a LCD panel. The touch mura cannot always be flashed in a very short period. Touch mura exists in almost every mode of LCD. In this paper, a new type of mura which generated during the LCD modu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd4e565d448329a46137960371fba460
https://doi.org/10.1002/j.2168-0159.2013.tb06434.x
https://doi.org/10.1002/j.2168-0159.2013.tb06434.x
Autor:
Raymond G. Greene, Cynthia C. Contreras, Tina M. Proulx, Robert S. Schweiger, Clive Darrell Gierbolini
Publikováno v:
SID Symposium Digest of Technical Papers. 42:655-658
Reducing LCD substrate thickness from 0.7 mm to 0.5 mm improves edge-light mura from glass thermal-stress birefringence by 26%. Sub nanometer (nm) resolution retardation measurements were performed on 1.1, 0.7, 0.5, 0.4, 0.3, and 0.1 mm thick substra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04c5f910a771c9fb55bd0ce349dfeb55
https://doi.org/10.1889/1.3621407
https://doi.org/10.1889/1.3621407