Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Ray Richetta"'
Autor:
Sudipto Chakraborty, David J. Frank, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Devin Underwood, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Dorothy Wisnieff, Christian W. Baks, Donald S. Bethune, John Timmerwilke, Thomas Fox, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
IEEE Journal of Solid-State Circuits. 57:3258-3273
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecde976f5a8ea2725ff21c9ef19f3a6e
https://doi.org/10.1109/jssc.2022.3201775
https://doi.org/10.1109/jssc.2022.3201775
Autor:
David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Chris Baks, John Timmerwilke, Peilin Song, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
2023 IEEE Custom Integrated Circuits Conference (CICC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35752c715ce596ad07fea4bd727c310e
https://doi.org/10.1109/cicc57935.2023.10121266
https://doi.org/10.1109/cicc57935.2023.10121266
Autor:
Kevin Tien, Ken Inoue, Scott Lekuch, David J. Frank, Sudipto Chakraborty, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Devin Underwood, Dorothy Wisnieff, Chris Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7004a5b736151ebd402643471834d3d2
https://doi.org/10.23919/date54114.2022.9774702
https://doi.org/10.23919/date54114.2022.9774702
Autor:
David J. Frank, Sudipto Chakraborty, Kevin Tien, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Shawn D. Chambers, Scott Lekuch, Ken Inoue, Devin Underwood, Dorothy Wisnieff, Chris Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman
Publikováno v:
2022 IEEE International Solid- State Circuits Conference (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2f821a15d5aee07baba4dde25fd358d
https://doi.org/10.1109/isscc42614.2022.9731538
https://doi.org/10.1109/isscc42614.2022.9731538
Conference
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.