Zobrazeno 1 - 10
of 32
pro vyhledávání: '"Ray Ladbury"'
Publikováno v:
IEEE Transactions on Nuclear Science. 68:597-602
A better understanding of the linear energy transfer (LET) and the range of proton recoil ions in gallium nitride (GaN) is necessary to properly evaluate GaN device radiation tolerance. By analyzing the LET and range of recoil heavy ions in GaN, we c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d52e1e0a81eeac8bb5e0a487bcebb396
https://doi.org/10.1109/tns.2021.3050980
https://doi.org/10.1109/tns.2021.3050980
Autor:
Megan C. Casey, Hak Kim, Anthony M. Phan, Ray Ladbury, Jean-Marie Lauenstein, Alyson D. Topper
Publikováno v:
IRPS
Heavy-ion radiation can result in silicon carbide power device degradation and/or catastrophic failure. Test procedures and data interpretation must consider the impact that heavy-ion induced off-state leakage current increases will have on subsequen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0b670e9be6da816c887ee6db4ffb005
https://doi.org/10.1109/irps46558.2021.9405180
https://doi.org/10.1109/irps46558.2021.9405180
Autor:
M. Friendlich, Christina M. Seidlick, Kenneth A. LaBel, Melanie D. Berg, Ray Ladbury, Hak Kim, Jonathan A. Pellish
Publikováno v:
IEEE Transactions on Nuclear Science. 60:2697-2703
We present a Single Event Upset (SEU) model with supporting data demonstrating frequency effects that deviate from conventional theory. The model emphasizes design topology versus circuit-element contributions to SEU cross sections.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21d7b9328f4ab49354f64be5d0c9fb20
https://doi.org/10.1109/tns.2013.2273938
https://doi.org/10.1109/tns.2013.2273938
Autor:
Leonard R. Rockett, Monir El-Diwany, Tuyet Bach, Paul W. Marshall, Cheryl J. Marshall, B.M. Haugerud, Reed K. Lawrence, Courtney Mitchell, Akil K. Sutton, John D. Cressler, J.P. Comeau, A. P. Gnana Prakash, Ray Ladbury, Nadim F. Haddad, Mustansir M. Pratapgarhwala
Publikováno v:
Solid-State Electronics. 50:181-190
The effects of proton and gamma irradiation on a new commercially available SiGe technology are investigated for the first time. The results of proton irradiation on a differential SiGe HBT LC oscillator are also reported in order to gauge circuit-le
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7eb9a1badf9669719a6fd11305aed1f8
https://doi.org/10.1016/j.sse.2005.11.007
https://doi.org/10.1016/j.sse.2005.11.007
Autor:
Ray Ladbury
Publikováno v:
Physics Today. 52:21-24
In 1996 and 1997, when seismic tomography began producing much improved images of Earth's mantle, many researchers thought they were witnessing the resolution of the debate over whether mantle convection takes place across the entire mantle, or rathe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::359677cf5cc56840264ebc058b9555ea
https://doi.org/10.1063/1.882774
https://doi.org/10.1063/1.882774
Autor:
Sam Burns, Martin A. Carts, Martha V. O'Bryan, Dakai Chen, Melanie D. Berg, James Fred Salzman, Stephen P. Buchner, Farokh Irom, Nick W. van Vonno, Jean-Marie Lauenstein, Hak Kim, Kenneth A. LaBel, E. T. Thomson, Jonathan A. Pellish, Alan P. Williams, Theju M. Bernard, Michael A. Xapsos, A.B. Sanders, T.R. Oldham, Ray Ladbury, L. G. Pearce, Anthony M. Phan, Paul W. Marshall, Rafi Albarian, H. W. Satterfield, Cheryl J. Marshall
Publikováno v:
2010 IEEE Radiation Effects Data Workshop.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd902712d5ef36e11326a0d346292407
https://doi.org/10.1109/redw.2010.5619494
https://doi.org/10.1109/redw.2010.5619494
Autor:
Paul W. Marshall, James Forney, C. Poivey, Dave Petrick, S.R. Cox, Ray Ladbury, S.P. Buchner, D.K. Hawkins, Mark P. Baze, Anthony Dung-phan, Martin A. Carts, Martha V. O'Bryan, S.D. Kniffin, Christina Seidleck, Jeremy Karsh, A.B. Sanders, Kenneth A. LaBel, Cheryl J. Marshall, Melanie D. Berg, J.W. Howard, Hak Kim, Ryan Flanigan, M. Friendlich, T.R. Oldham, Wes Powell, T.L. Irwin
Publikováno v:
2007 IEEE Radiation Effects Data Workshop.
Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e2f1ee628870278c3efa00c683b8b39
https://doi.org/10.1109/redw.2007.4342557
https://doi.org/10.1109/redw.2007.4342557
Autor:
Ray Ladbury
Publikováno v:
Physics Today. 51:19-21
As microelectronic devices continue to shrink, submicrometer‐sized contaminants pose a serious threat to semiconductor yields and performance—and thereby to the profits of the nearly $200 billion a year industry. Chemical analysis of these tiny p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0aa10a6a046c9b919f47277740e4d23c
https://doi.org/10.1063/1.2805869
https://doi.org/10.1063/1.2805869
Autor:
Ray Ladbury
Publikováno v:
Physics Today. 51:19-21
To understand why the Bolivian earthquake of 9 June 1994 has so rapidly become one of the most thoroughly studied seismic events in history, one must know a little about both the event and the significance of when and where it occurred. (See PHYSICS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3228304a9b0707c9467a23dba56d36f
https://doi.org/10.1063/1.882255
https://doi.org/10.1063/1.882255
Autor:
Ray Ladbury
Publikováno v:
Physics Today. 51:17-19
Ever since its formation roughly 4.5 billion years ago, Earth's core has played an important role in nearly every aspect of the planet's geologic history—from plate tectonics to the evolution of life. However, exactly how the core formed remains un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ac98bda0414054a44272539fe829624
https://doi.org/10.1063/1.882179
https://doi.org/10.1063/1.882179