Zobrazeno 1 - 10
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pro vyhledávání: '"Ray F. Egerton"'
Autor:
Ray F. Egerton
Publikováno v:
Microscopy Today. 29:56-59
Different aspects of electron-beam damage are summarized, together with some quantitative evaluation. TEM and STEM are compared in terms of information-to-damage ratio. Electron-beam fabrication is briefly considered in terms of resolution and writin
Autor:
Ray F. Egerton
Publikováno v:
Ultramicroscopy. 229
Practical aspects of dosimetry are considered, including the measurement of electron-beam current and current density. Complications that arise in the case of a focused probe or a STEM image are discussed and solutions proposed. Advantages of express
Autor:
Ray F. Egerton, Masashi Watanabe
Publikováno v:
Microscopy (Oxford, England). 71(Supplement_1)
X-ray analysis is one of the most robust approaches to extract quantitative information from various materials and is widely used in various fields ever since Raimond Castaing established procedures to analyze electron-induced X-ray signals for mater
Autor:
Ray F. Egerton
Publikováno v:
Microscopy and Microanalysis. 26:84-86
Autor:
Masashi Watanabe, Ray F. Egerton
Publikováno v:
Microscopy and Microanalysis. 26:1512-1514
Autor:
Masashi Watanabe, Ray F. Egerton
Publikováno v:
Ultramicroscopy. 193:111-117
Fitted with a field emission source, aberration-corrected optics and an energy-dispersive X-ray detector of large solid angle, a modern analytical TEM can generate a current density high enough to chemically identify a single metal atom within a frac
Publikováno v:
Zaguán: Repositorio Digital de la Universidad de Zaragoza
Universidad de Zaragoza
Digital.CSIC. Repositorio Institucional del CSIC
instname
Zaguán. Repositorio Digital de la Universidad de Zaragoza
Universidad de Zaragoza
Digital.CSIC. Repositorio Institucional del CSIC
instname
Zaguán. Repositorio Digital de la Universidad de Zaragoza
In this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate design, also referred to as the Volta phase plate. We discuss the implementation, operating prin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f0b515982851e52beea3ea2241b83867
https://hdl.handle.net/11380/1270645
https://hdl.handle.net/11380/1270645
Autor:
Darren Homeniuk, Sean Chen, Drew Price, Ray F. Egerton, Karan Kumar, Marek Malac, Misa Hayashida, Jason L. Pitters, Martin Cloutier, D. Vick, Jesus Alejandro Marin-Calzada, Mark Salomons, Darren Wen
Publikováno v:
Microscopy and Microanalysis. 27:1062-1063
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 26(6)
The authors discuss the dipole vibrational modes that predominate in the energy-loss spectra of ionic materials below 1 eV, concentrating on thin-film specimens of typical transmission electron microscopy (TEM) thickness. The thickness dependence of
Autor:
Drew Price, Jason L. Pitters, Misa Hayashida, Suliat Yakubu, D. Vick, Marek Malac, Marcus Leeson, Sean Chen, Mark Salomons, Ray F. Egerton, Darren Homeniuk, Martin Cloutier
We are developing a modular (scanning) transmission electron microscope (S)TEM, referred to as NanoMi, which is released under an open source license by the National Research Council, Canada; see for updates. The electron microscope (EM) is a critica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::15ebeef09b39e12ee951841d9f7111f7
https://doi.org/10.1017/s1431927620019431
https://doi.org/10.1017/s1431927620019431