Zobrazeno 1 - 10
of 93
pro vyhledávání: '"Ray D. Twesten"'
Autor:
James L. Hart, Andrew C. Lang, Asher C. Leff, Paolo Longo, Colin Trevor, Ray D. Twesten, Mitra L. Taheri
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-14 (2017)
Abstract In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection tech
Externí odkaz:
https://doaj.org/article/68b997663aa64bffadbb628d43c9d51b
Publikováno v:
Microscopy and Microanalysis. 27:1070-1073
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f0e2df0ca5b997d436147bce34c2c87
https://doi.org/10.1017/s1431927621004049
https://doi.org/10.1017/s1431927621004049
Publikováno v:
Microscopy and Microanalysis. 27:2626-2628
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a06e1f0aea769b8a0ff0fed30f63428a
https://doi.org/10.1017/s1431927621009314
https://doi.org/10.1017/s1431927621009314
Publikováno v:
Microscopy and Microanalysis. 27:630-632
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a7e4b946002f8cbc34a6e9e9b7fb9fe
https://doi.org/10.1017/s1431927621002658
https://doi.org/10.1017/s1431927621002658
Autor:
Paolo Longo, Andrew C. Lang, Mitra L. Taheri, Asher C. Leff, Ray D. Twesten, James L. Hart, Colin Trevor
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-14 (2017)
Scientific Reports
Scientific Reports
In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection technology ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e38b34bdff98c9b48409c413ad11b5c
https://doaj.org/article/68b997663aa64bffadbb628d43c9d51b
https://doaj.org/article/68b997663aa64bffadbb628d43c9d51b
Publikováno v:
Microscopy and Microanalysis. 26:1676-1677
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0549f097292be367d7a48f76ad145648
https://doi.org/10.1017/s1431927620018930
https://doi.org/10.1017/s1431927620018930
Publikováno v:
Ultramicroscopy. 212
Direct electron detectors (DeDs) have been widely used for imaging studies because of their higher beam sensitivity, lower noise, improved pixel resolution, etc. However, there have been limited studies related to the performance in spectroscopic app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6302482f57e7a99381bcc3cf8eddba51
https://pubmed.ncbi.nlm.nih.gov/32114314
https://pubmed.ncbi.nlm.nih.gov/32114314
Publikováno v:
Microscopy and Microanalysis. 25:588-589
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f42d24634ecb5dcba15496207e619e0
https://doi.org/10.1017/s1431927619003672
https://doi.org/10.1017/s1431927619003672
Publikováno v:
Microscopy and Microanalysis. 25:680-681
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::455dc935cd2da3ba5b722c61a2aaeca3
https://doi.org/10.1017/s1431927619004136
https://doi.org/10.1017/s1431927619004136
Publikováno v:
Microscopy and Microanalysis. 25:586-587
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f28f9bad38effee4d029fbf0a1730e38
https://doi.org/10.1017/s1431927619003660
https://doi.org/10.1017/s1431927619003660