Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Rawi Dirawi"'
Autor:
Hyun-Sok Kim, Ikhyun Jeong, Baikkyu Hong, Sunouk Nam, Sumin Jang, Kangmin Lee, Hongpeng Su, Minho Jeong, Mingyu Kim, Hongcheon Yang, Wayne Zhou, Nanglyeom Oh, DongSub Choi, Tal Yaziv, Hedvi Spielberg, Ohad Bachar, Rawi Dirawi
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78f51fe1a7382a07e568f494f3690c2e
https://doi.org/10.1117/12.2657678
https://doi.org/10.1117/12.2657678
Autor:
Hyunsok Kim, Jaewuk Ju, Ikhyun Jeong, Baikkyu Hong, Sunouk Nam, Changkyu Lee, Kangmin Lee, Sumin Jang, Jaeyoun Lee, Hongcheon Yang, Minho Jeong, Mingyu Kim, Hongpeng Su, Wayne Zhou, Nanglyeom Oh, DongSub Choi, Tal Yaziv, Hedvi Spielberg, Ohad Bachar, Renan Milo, Rawi Dirawi
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c05aa936e1e9836d39d6691bea3e420
https://doi.org/10.1117/12.2657632
https://doi.org/10.1117/12.2657632
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c4105566cf4a253244932c16314fa8c
https://doi.org/10.1117/12.2608255
https://doi.org/10.1117/12.2608255
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ebbd01a5b05ea60462bd5c85b08479f
https://doi.org/10.1117/12.2608241
https://doi.org/10.1117/12.2608241
Publikováno v:
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.
On Product Overlay (OPO) control is a critical factor in advanced semiconductor manufacturing. As feature sizes become smaller, OPO budgets become tighter, leaving less room for overlay (OVL) measurement inaccuracy. Over the last few years, overlay m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::435041e573e68842525f1759a4f09ea4
https://doi.org/10.1117/12.2583616
https://doi.org/10.1117/12.2583616
Autor:
Rawi Dirawi, A. Yagil, Yevgeniy Men, Tal Yaziv, Alon Volfman, Renan Milo, Weiling Lin, Yuval Lamhot
Publikováno v:
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV.
A new algorithm called Single Wavelength Overlay Optimizer (SWOOP) enhances the performance of single-wavelength optical diffraction-based overlay metrology. SWOOP combines statistical learning with a physical model to advance the performance of sing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3b164cef853767256480dfe00fe2ccb
https://doi.org/10.1117/12.2583866
https://doi.org/10.1117/12.2583866
Autor:
Ossama Assad, Hossam Haick, Rawi Dirawi, Silke Christiansen, Bin Wang, Nisreen Shehada, Thomas Stelzner
Publikováno v:
ACS Applied Materials & Interfaces; Vol 4
Aligned arrays of silicon nanowires (aa-Si NWs) allow the exploitation of Si NWs in a scalable way. Previous studies explored the influence of the Si NWs' number, doping density, and diameter on the related electrical performance. Nevertheless, the o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7ca998bbc0fd921e56a7f0e3213773a0
Publikováno v:
Nano letters. 11(4)
Fuel cells (FCs) are promising electrochemical devices that convert chemical energy of fuels directly into electrical energy. We present a new anode material based on nanotextured metal copper for fuel cell applications. We have demonstrated that low
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e2e69670c2dd068bc8ab0f1e2e6eaf9f
https://pubmed.ncbi.nlm.nih.gov/21438594
https://pubmed.ncbi.nlm.nih.gov/21438594
Publikováno v:
Nano Letters; Apr2011, Vol. 11 Issue 4, p1727-1732, 6p