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pro vyhledávání: '"Ravikiran Yeleswarapu"'
Autor:
Ravikiran Yeleswarapu, Arun K. Somani
Publikováno v:
PeerJ Computer Science, Vol 7, p e359 (2021)
As DRAM technology continues to evolve towards smaller feature sizes and increased densities, faults in DRAM subsystem are becoming more severe. Current servers mostly use CHIPKILL based schemes to tolerate up-to one/two symbol errors per DRAM beat.
Externí odkaz:
https://doaj.org/article/eaf9fdccaab749f8a9b78189ad37a948
Autor:
Ravikiran Yeleswarapu
As DRAM technology continues to evolve towards smaller feature sizes and increased densities, faults in DRAM subsystem are becoming more severe. Current servers mostly use CHIPKILL based schemes to tolerate up-to one/two symbol errors per DRAM beat.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::618c246893a479ed18c9d5e6c6979098
https://doi.org/10.31274/etd-20201022-0
https://doi.org/10.31274/etd-20201022-0
Autor:
Arun K. Somani, Ravikiran Yeleswarapu
Publikováno v:
PRDC
As DRAM technology continues to evolve towards smaller feature sizes and increased densities, faults in DRAM subsystem are becoming more severe. Current servers mostly use CHIPKILL based schemes to tolerate up-to one/two symbol errors per DRAM beat.