Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Ravi Sankar Vunnam"'
Autor:
Ravi Sankar Vunnam, Michael J. Hill, Gerhard Schrom, Arun Krishnamoorthy, Ryan Ferguson, Sarath Makala
Publikováno v:
ITC
Fully Integrated Voltage Regulators (FIVRs) are switching voltage regulators integrated on to the same die as the CPU and Graphics cores, in 4th and 5th generation Intel® Core™ microprocessors. Practical limitations prevent the application of trad
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4ae832b8c934a173aca93308927ddd0
https://doi.org/10.1109/itc44170.2019.9000125
https://doi.org/10.1109/itc44170.2019.9000125
Publikováno v:
MWSCAS
A 16-phase Pulse Width Modulator (PWM) for Fully Integrated Voltage Regulators (FIVR) manufactured on a 22nm tri-gate CMOS process is presented. The PWM supports a wide operating frequency range of 20MHz- 320MHz, individually programmable phase angle
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d97dc6a6195dffc2f8f6c6f3c1221f0f
https://doi.org/10.1109/mwscas.2019.8885345
https://doi.org/10.1109/mwscas.2019.8885345
Publikováno v:
2019 IEEE Applied Power Electronics Conference and Exposition (APEC).
In this paper we present high-speed soft-switching bridge drivers for a DC-DC step-down Fully Integrated Voltage Regulator (FIVR) using air-core inductors (ACIs) and manufactured using a 22nm process. The bridge drivers implement Zero-Voltage-Switchi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::462f9bfd429ee0c8a579dd084bd136ee
https://doi.org/10.1109/apec.2019.8722229
https://doi.org/10.1109/apec.2019.8722229
Publikováno v:
2019 IEEE Applied Power Electronics Conference and Exposition (APEC).
Modern microprocessors impose stringent constraints on power supply design. Large voltage droops caused by the high output current slew rate (di/dt) requirements of advanced microprocessor features are one of the significant challenges for power supp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97d63590e2baf148226756ac0fc59620
https://doi.org/10.1109/apec.2019.8722207
https://doi.org/10.1109/apec.2019.8722207