Zobrazeno 1 - 10
of 1 930
pro vyhledávání: '"Raut, M"'
Autor:
Mei, D. -M., Panth, R., Kooi, K., Mei, H., Bhattarai, S., Raut, M., Acharya, P., Wang, G. -J.
By studying charge trapping in germanium (Ge) detectors operating at temperatures below 10 K, we demonstrate for the first time that the formation of cluster dipole states from residual impurities is responsible for charge trapping. Two planar detect
Externí odkaz:
http://arxiv.org/abs/2203.15904
We explore the possibility to use advanced germanium (Ge) detectors as a low-energy solar neutrino observatory by means of neutrino-nucleus elastic scattering. A Ge detector utilizing internal charge amplification for the charge carriers created by t
Externí odkaz:
http://arxiv.org/abs/2104.14352
Autor:
Panth, R., Wei, W. -Z., Mei, D. -M., Liu, J., Bhattarai, S., Mei, H., Raut, M., Acharya, P., Kooi, K., Wang, G. -J.
The exploration of germanium (Ge) detectors with amorphous Ge (a-Ge) contacts has drawn attention to the searches for rare-event physics such as dark matter and neutrinoless double-beta decay. The charge barrier height (CBH) of the a-Ge contacts depo
Externí odkaz:
http://arxiv.org/abs/2101.09322
Autor:
Raut, M. -S., Mei, H., Mei, D. -M., Bhattarai, S., Wei, W. -Z., Panda, R., Acharya, P., Wang, G. -J.
High-purity germanium (HPGe) crystals are required to be well-characterized before being fabricated into Ge detectors. The characterization of HPGe crystals is often performed with the Hall Effect system, which measures the carrier concentration, the
Externí odkaz:
http://arxiv.org/abs/2002.07706
Autor:
Bhattarai, S., Panth, R., Wei, W. -Z., Mei, H., Mei, D. -M., Raut, M. S., Acharya, P., Wang, W. -J.
Electrical conduction mechanisms in the disordered material system is experimentally studied for p-type amorphous germanium (a-Ge) used for high-purity Ge detector contacts. The localization length and the hopping parameters in a-Ge are determined us
Externí odkaz:
http://arxiv.org/abs/2002.07707
Autor:
Mei, D. -M., Mukund, R. B, Wei, W. -Z., Panth, R., Liu, J., Mei, H., Li, Y. -Y., Acharya, P., Bhattarai, S., Kooi, K., Raut, M-S., Sun, X. -S., Kirkvold, A., Dong, K. -M., Meng, X. -H., Wang, G. -J., Yang, G.
Charge trapping degrades the energy resolution of germanium (Ge) detectors, which require to have increased experimental sensitivity in searching for dark matter and neutrinoless double-beta decay. We investigate the charge trapping processes utilizi
Externí odkaz:
http://arxiv.org/abs/1909.05806
Autor:
Squires P; Merck & Co, Inc, Rahway, NJ., Puckett J; COVIA Health Solutions, Lansdale, PA. Electronic address: justin@coviahealthsolutions.com., Ryland KE; Merck & Co, Inc, Rahway, NJ., Kamal-Bahl S; COVIA Health Solutions, Lansdale, PA. Electronic address: sachin@coviahealthsolutions.com., Raut M; Merck & Co, Inc, Rahway, NJ., Doshi J; Division of General Internal Medicine, Perelman School of Medicine, University of Pennsylvania, Philadelphia, PA., Huntington SF; Department of Internal Medicine, Section of Hematology, Yale University School of Medicine, New Haven, CT.
Publikováno v:
Clinical lymphoma, myeloma & leukemia [Clin Lymphoma Myeloma Leuk] 2024 Oct; Vol. 24 (10), pp. e350-e358.e1. Date of Electronic Publication: 2024 Jun 04.
Autor:
Elghazy E; Department of Chemical and Biological Engineering, The University of Sheffield, Sheffield, United Kingdom; Department of Construction and Building Engineering, Arab Academy for Science, Technology, and Maritime Transport, Cairo, Egypt., Syed Mohamed SMD; Department of Materials Science and Engineering, The University of Sheffield, Sheffield, United Kingdom., Wianglor K; Department of Chemical and Biological Engineering, The University of Sheffield, Sheffield, United Kingdom., Tetali S; Department of Materials Science and Engineering, The University of Sheffield, Sheffield, United Kingdom., Raut M; Department of Materials Science and Engineering, The University of Sheffield, Sheffield, United Kingdom., Roy I; Department of Materials Science and Engineering, The University of Sheffield, Sheffield, United Kingdom; Insigneo Institute of In Silico Medicine, The University of Sheffield, Sheffield, United Kingdom. Electronic address: i.roy@sheffield.ac.uk., Pandhal J; Department of Chemical and Biological Engineering, The University of Sheffield, Sheffield, United Kingdom. Electronic address: j.pandhal@sheffield.ac.uk.
Publikováno v:
New biotechnology [N Biotechnol] 2024 Nov 25; Vol. 83, pp. 133-141. Date of Electronic Publication: 2024 Aug 10.
Autor:
Raut M; Department of Prosthodontics, Dr. Rajesh R. Kambe Dental College and Hospital, Akola, Maharashtra, India., Kharat S; Department of Prosthodontics, Dr. Rajesh R. Kambe Dental College and Hospital, Akola, Maharashtra, India., Shetty K; Department of Prosthodontics, Dr. Rajesh R. Kambe Dental College and Hospital, Akola, Maharashtra, India., Gangde P; Department of Prosthodontics, Dr. Rajesh R. Kambe Dental College and Hospital, Akola, Maharashtra, India., Gupta P; Department of Prosthodontics, Dr. Rajesh R. Kambe Dental College and Hospital, Akola, Maharashtra, India., Devhade M; Department of Prosthodontics, Dr. Rajesh R. Kambe Dental College and Hospital, Akola, Maharashtra, India.
Publikováno v:
Journal of pharmacy & bioallied sciences [J Pharm Bioallied Sci] 2024 Jul; Vol. 16 (Suppl 3), pp. S3009-S3011. Date of Electronic Publication: 2024 Jul 18.
Autor:
Garg M; Merck & Co., Inc., Rahway, NJ., Puckett J; COVIA Health Solutions, PA., Kamal-Bahl S; COVIA Health Solutions, PA. Electronic address: sachin@coviahealthsolutions.com., Raut M; Merck & Co., Inc., Rahway, NJ., Ryland KE; Merck & Co., Inc., Rahway, NJ., Doshi JA; Division of General Internal Medicine, Perelman School of Medicine, University of Pennsylvania, Philadelphia, PA., Huntington SF; Department of Internal Medicine, Section of Hematology, Yale University School of Medicine, New Haven, CT.
Publikováno v:
Clinical lymphoma, myeloma & leukemia [Clin Lymphoma Myeloma Leuk] 2024 May; Vol. 24 (5), pp. e181-e190. Date of Electronic Publication: 2024 Feb 09.