Zobrazeno 1 - 10
of 52
pro vyhledávání: '"Rath, D.L."'
Autor:
Hu, C.-K., Canaperi, D., Chen, S.T., Gignac, L.M., Kaldor, S., Krishnan, M., Malhotra, S.G., Liniger, E., Lloyd, J.R., Rath, D.L., Restaino, D., Rosenberg, R., Rubino, J., Seo, S.-C., Simon, A., Smith, S., Tseng, W.-T.
Publikováno v:
In Thin Solid Films 2006 504(1):274-278
Autor:
Filippi, R.G *, Gribelyuk, M.A, Joseph, T, Kane, T, Sullivan, T.D, Clevenger, L.A, Costrini, G, Gambino, J, Iggulden, R.C, Kiewra, E.W, Ning, X.J, Ravikumar, R, Schnabel, R.F, Stojakovic, G, Weber, S.J, Gignac, L.M, Hu, C.-K, Rath, D.L, Rodbell, K.P
Publikováno v:
In Thin Solid Films 2001 388(1):303-314
Autor:
Hu, C.-K., Canaperi, D., Chen, S.T., Gignac, L.M., Herbst, B., Kaldor, S., Krishnan, M., Liniger, E., Rath, D.L., Restaino, D., Rosenberg, R., Rubino, J., Seo, S.-C., Simon, A., Smith, S., Tseng, W.-T.
Publikováno v:
Proceedings of the 2004 IEEE International Reliability Physics Symposium; 2004, p222-228, 7p
Autor:
Nitta, S., Purushothaman, S., Smith, S., Krishnan, M., Canaperi, D., Dalton, T., Volksen, W., Miller, R.D., Herbst, B., Hu, C.K., Liniger, E., Lloyd, J., Lane, M., Rath, D.L., Colburn, M., Gignac, L.
Publikováno v:
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p321-324, 4p
Publikováno v:
IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference & Workshop Theme-Innovative Approaches to Growth in the Semiconductor Industry ASMC 96 Proceedings; 1996, p308-313, 6p
Autor:
Ravikumar, R., Rath, D.L., Delehanty, D.J., Filippi, R.G., Kiewra, E.W., Stojakovic, G., McCullough, K.J., Miura, D.D., Gambino, J., Schnabel, F., Rhoads, B.N.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; January 2001, Vol. 76 Issue: 1 p51-54, 4p
Autor:
Rath, D.L., Ravikumar, R., Delehanty, D.J., Filippi, R.G., Kiewra, E.W., Stojakovic, G., McCullough, K.J., Miura, D.D., Rhoads, B.N.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; January 2001, Vol. 76 Issue: 1 p31-34, 4p
Autor:
Ravikumar, R., Filippi, R.G., Iggulden, R.C., Kiewra, E.W., Kirihata, T., Kitahara, H., Lee, G.Y., Liegl, B., Matsunaga, T., Ning, X.J., Rath, D.L., Stojakovic, G., Weber, S.J.
Publikováno v:
Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat No99EX247); 1999, p203-205, 3p
Publikováno v:
Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat No99EX247); 1999, p146-148, 3p
Autor:
Herman, D.A., Trouilloud, P.L., Argyle, B.E., Petek, B., Romankiw, L.T., Bezama, J.S., Rath, D.L., Canaperi, D.F., Komsa, M.L.
Publikováno v:
IEEE Transactions on Magnetics; 1988, Vol. 24 Issue 6, p3066-3068, 3p