Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Rasmus B. Nielsen"'
Autor:
Yijian Meng, Ming Lai Chan, Rasmus B. Nielsen, Martin H. Appel, Zhe Liu, Ying Wang, Nikolai Bart, Andreas D. Wieck, Arne Ludwig, Leonardo Midolo, Alexey Tiranov, Anders S. Sørensen, Peter Lodahl
Publikováno v:
Nature Communications, Vol 15, Iss 1, Pp 1-7 (2024)
Abstract Deterministic photon sources allow long-term advancements in quantum optics. A single quantum emitter embedded in a photonic resonator or waveguide may be triggered to emit one photon at a time into a desired optical mode. By coherently cont
Externí odkaz:
https://doaj.org/article/355acca573f64019a2011d5ac2e67f64
Autor:
Margaux Moore, Rasmus B Nielsen, Ahmad Al-Douri, Mahmoud M. El-Halwagi, Abdulrahman S. Alsuhaibani, Amro A. El-Baz
Publikováno v:
The Canadian Journal of Chemical Engineering. 100:1178-1186
Publikováno v:
Current Opinion in Chemical Engineering. 31:100670
Decarbonization of the maritime transportation fuels is a primary objective of the shipping industry. Ammonia is an attractive option because of its relatively low greenhouse gas (GHG) emissions, high energy density, competitive cost, and ubiquitous
Autor:
Sunhwa Park, Rasmus B Nielsen, Selma Atilhan, Mert Atilhan, Margaux Moore, Mahmoud M. El-Halwagi
Publikováno v:
Current Opinion in Chemical Engineering. 31:100668
There is growing pressure to reduce greenhouse gas (GHG) emissions from maritime transportation. One of the most effective strategies for reducing GHG emissions is to switch from conventional fuels such as heavy fuel oil to alternative fuels. Green h
Autor:
Greg Yang, Insung Kim, Natalia Davydova, Chris Strolenberg, Rasmus B. Nielsen, Tjitte Nooitgedacht, Jeong-ho Yeo, Shawn Lee, Peter Nikolsky, Chang-min Park
Publikováno v:
SPIE Proceedings.
As the ITRS Critical Dimension Uniformity (CDU) specification shrinks, semiconductor companies need to maintain a high yield of good wafers per day and a high performance (and hence market value) of finished products. This cannot be achieved without
Autor:
Natalia Davydova, Shawn Lee, Tjitte Nooitgedacht, Insung Kim, Chang-min Park, Rasmus B. Nielsen, Greg Yang, Jeong-ho Yeo, Chris Strolenberg, Peter Nikolsky
Publikováno v:
Journal of Micro/Nanolithography, MEMS, and MOEMS. 12:021006
As the International Technology Roadmap for Semiconductors critical dimension uniformity (CDU) specification shrinks, semiconductor companies need to maintain a high yield of good wafers per day and high performance (and hence market value) of finish