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pro vyhledávání: '"Raphael Perdreau"'
Autor:
Mélanie Diogo, Jean-Paul Rebrassé, Raphael Perdreau, Fabien Allanic, Tony Moinet, Nicolas Vivet, Amandine Aubert
Publikováno v:
Materials Sciences and Applications. :326-347
In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of the atomic force microscopy (AFM)-based electrical techniques which provide unique junction characterization, other method
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76d24224cd7a71502c91f5dc4338e64f
https://doi.org/10.4236/msa.2016.76030
https://doi.org/10.4236/msa.2016.76030
