Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Raphaël Hahn"'
Publikováno v:
Physical Review X, Vol 14, Iss 1, p 011034 (2024)
The ion-molecule reactions D_{2}^{+}+NH_{3} and D_{2}^{+}+ND_{3} are studied at low collision energies (E_{coll} from zero to approximately k_{B}×50 K), with the D_{2}^{+} ions in the ground rovibrational state and for different rotational temperatu
Externí odkaz:
https://doaj.org/article/5371712302c8452b93af4b31e7eb7c91
Autor:
Katharina Höveler, Johannes Deiglmayr, Josef A. Agner, Raphaël Hahn, Valentina Zhelyazkova, Frédéric Merkt
Publikováno v:
Physical Review A, 106 (5)
In 1954, Vogt and Wannier (Phys. Rev. 95, 1190) predicted that the capture rate of a polarizable neutral atom or molecule by an ion should increase by a factor of two compared to the classical Langevin rate as the collision energy approaches zero. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::573154de884ee8c62add58cbf7278775
Autor:
Raphaël Hahn, Thomas Battard, Oscar Boucher, Yan J. Picard, Hans Lignier, Daniel Comparat, Nolwenn-Amandine Keriel, Colin Lopez, Emanuel Oswald, Morgan Reveillard, Matthieu Viteau
Publikováno v:
Review of Scientific Instruments. 93:043302
We have performed a study of several cesium oven designs. A comparison between recirculating (or sticking-wall) and collimating (or re-emitting-wall) ovens is made in order to extract the most efficient design in terms of beam brightness. Unfortunate
Autor:
A. Lafosse, Marian Mankos, Gerd Schönhense, L. Amiaud, Daniel Comparat, Nicholas Barrett, Khashayar Shadman, Raphaël Hahn, Yan J. Picard, O. Fedchenko
Publikováno v:
Ultramicroscopy
Ultramicroscopy, Elsevier, 2019, 207, pp.112848. ⟨10.1016/j.ultramic.2019.112848⟩
Ultramicroscopy, 2019, 207, pp.112848. ⟨10.1016/j.ultramic.2019.112848⟩
Ultramicroscopy, Elsevier, 2019, 207, pp.112848. ⟨10.1016/j.ultramic.2019.112848⟩
Ultramicroscopy, 2019, 207, pp.112848. ⟨10.1016/j.ultramic.2019.112848⟩
International audience; An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a la