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Autor:
Lasseter J; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States., Gellerup S; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States., Ghosh S; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Yun SJ; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Vasudevan R; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Unocic RR; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Olunloyo O; Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, United States., Retterer ST; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Xiao K; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Randolph SJ; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Rack PD; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Feb 21; Vol. 16 (7), pp. 9144-9154. Date of Electronic Publication: 2024 Feb 12.
Autor:
Lasseter J; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA., Rack PD; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA., Randolph SJ; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Publikováno v:
Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2023 Feb 17; Vol. 13 (4). Date of Electronic Publication: 2023 Feb 17.
Cryogenic electron microscopy reveals that applied pressure promotes short circuits in Li batteries.
Autor:
Harrison KL; Nanoscale Sciences, Sandia National Laboratories, Albuquerque, NM 87123, USA., Merrill LC; Nanoscale Sciences, Sandia National Laboratories, Albuquerque, NM 87123, USA., Long DM; Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM 87123, USA., Randolph SJ; Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR 97124, USA., Goriparti S; Nanoscale Sciences, Sandia National Laboratories, Albuquerque, NM 87123, USA., Christian J; Materials & Structural Analysis Division, Thermo Fisher Scientific, Hillsboro, OR 97124, USA., Warren B; Nanoscale Sciences, Sandia National Laboratories, Albuquerque, NM 87123, USA., Roberts SA; Thermal/Fluid Component Science, Sandia National Laboratories, Albuquerque, NM 87123, USA., Harris SJ; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA., Perry DL; Materials Characterization and Performance, Sandia National Laboratories, Albuquerque, NM 87123, USA., Jungjohann KL; Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM 87123, USA.
Publikováno v:
IScience [iScience] 2021 Nov 01; Vol. 24 (12), pp. 103394. Date of Electronic Publication: 2021 Nov 01 (Print Publication: 2021).
Autor:
Kianinia M; School of Mathematical and Physical Sciences, University of Technology Sydney, P.O. Box 123, Broadway, NSW 2007 Australia. Charlene Lobo, charlene.lobo@uts.edu.au igor.aharonovich@uts.edu.au m.toth@uts.edu.au., Shimoni O; School of Mathematical and Physical Sciences, University of Technology Sydney, P.O. Box 123, Broadway, NSW 2007 Australia. Charlene Lobo, charlene.lobo@uts.edu.au igor.aharonovich@uts.edu.au m.toth@uts.edu.au., Bendavid A; CSIRO Manufacturing, Lindfield, NSW 2070, Australia., Schell AW; Department of Electronic Science and Engineering, Kyoto University, Kyoto daigaku-katsura, Nishikyo-ku, Kyoto, Japan., Randolph SJ; FEI Company, 5350 NE Dawson Creek Dr., Hillsboro, OR 97124, USA., Toth M; School of Mathematical and Physical Sciences, University of Technology Sydney, P.O. Box 123, Broadway, NSW 2007 Australia. Charlene Lobo, charlene.lobo@uts.edu.au igor.aharonovich@uts.edu.au m.toth@uts.edu.au., Aharonovich I; School of Mathematical and Physical Sciences, University of Technology Sydney, P.O. Box 123, Broadway, NSW 2007 Australia. Charlene Lobo, charlene.lobo@uts.edu.au igor.aharonovich@uts.edu.au m.toth@uts.edu.au., Lobo CJ; School of Mathematical and Physical Sciences, University of Technology Sydney, P.O. Box 123, Broadway, NSW 2007 Australia. Charlene Lobo, charlene.lobo@uts.edu.au igor.aharonovich@uts.edu.au m.toth@uts.edu.au.
Publikováno v:
Nanoscale [Nanoscale] 2016 Oct 27; Vol. 8 (42), pp. 18032-18037.
Autor:
Bresin M; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA., Botman A; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Randolph SJ; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Straw M; 2 FEI Company, 5350 Dawson Creek Drive, Hillsboro, OR 97214, USA., Hastings JT; 1 Department of Electrical and Computer Engineering, University of Kentucky, 453 F. Paul Anderson Tower, Lexington, KY 40506, USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2014 Apr; Vol. 20 (2), pp. 376-84. Date of Electronic Publication: 2014 Mar 03.