Zobrazeno 1 - 10
of 263
pro vyhledávání: '"Randall L. Geiger"'
Publikováno v:
2022 IEEE International Symposium on Circuits and Systems (ISCAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0df47dfe03d23a4678c314bb0488c10e
https://doi.org/10.1109/iscas48785.2022.9937611
https://doi.org/10.1109/iscas48785.2022.9937611
Autor:
Kyoohyun Noh, Tao Chen, Aydin Ilker Karsilayan, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Jose Silva-Martinez, Randall L. Geiger, Degang Chen, Dadian Zhou, Chulhyun Park
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 67:3618-3629
This paper introduces a 12 bit 2.5 bit/cycle SAR-based pipeline ADC employing a self-bias gain boosting amplifier. The single-stage amplifier achieves a low-frequency gain of 37 dB, while consuming 1.3 mW of power consumption with 1.3 V of analog pow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6fbf9988d2d670824ec91591a19a5fe0
https://doi.org/10.1109/tcsi.2020.3006149
https://doi.org/10.1109/tcsi.2020.3006149
Autor:
Jose Silva-Martinez, Dadian Zhou, Randall L. Geiger, Hao Meng, Tao Chen, Degang Chen, Chulhyun Park
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 69:3516-3526
State-of-the-art analog-to-digital converter (ADC) built-in self-test (BIST) methods relax the test stimulus linearity but require a constant voltage shift during testing. A low-cost on-chip BIST solution with a modified R2R digital-to-analog convert
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d85f00a7704099b2ef24ee5fa4fe8ffc
https://doi.org/10.1109/tim.2019.2936716
https://doi.org/10.1109/tim.2019.2936716
Autor:
Tao Chen, Degang Chen, Chulhyun Park, Randall L. Geiger, Shravan K. Chaganti, Jose Silva-Martinez
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 69:729-738
A novel ultrafast and low-cost pipelined analog-to-digital converter (ADC) testing and calibration method is proposed. The ADC nonlinearities are modeled as segmented parameters with interstage gain errors. During the test phase, a pure sine wave is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c46a46adc728feb7d5e10daf33bf7e92
https://doi.org/10.1109/tim.2019.2907035
https://doi.org/10.1109/tim.2019.2907035
Publikováno v:
MWSCAS
A method for designing high precision bandgap voltage references which expresses the zero-Kelvin bandgap voltage of silicon (V GO ), a physical temperature-independent constant, at the output over a wide temperature range is proposed. In contrast to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::931047e3c7169f39429f26f28c552e76
https://doi.org/10.1109/mwscas48704.2020.9184544
https://doi.org/10.1109/mwscas48704.2020.9184544
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 65:2059-2069
Linearity testing of analog-to-digital converters (ADCs) is very challenging and expensive due to the stringent linearity requirement on the stimulus and the extremely long test time. This paper introduces a novel method for ADC static linearity test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b88d7aab22108f7c80f84c1630d851ae
https://doi.org/10.1109/tcsi.2017.2775632
https://doi.org/10.1109/tcsi.2017.2775632
Publikováno v:
MWSCAS
A Nonlinear Device Converter is introduced that can be used to create useful new nonlinear devices whose characteristics differ significantly from those of the small number of basic devices that are currently available. The Nonlinear Device Converter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1338ae121204fa9320066c0c9cea250a
https://doi.org/10.1109/mwscas.2019.8885338
https://doi.org/10.1109/mwscas.2019.8885338
Publikováno v:
MWSCAS
A bandgap voltage reference circuit using a curvature elimination approach is proposed. Curvature elimination is achieved by a weighted subtraction of the outputs of two basic bandgap circuits that have the same functional form as the curvature. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5a91ed8ce62c30969e68d289fcd6da7
https://doi.org/10.1109/mwscas.2019.8884873
https://doi.org/10.1109/mwscas.2019.8884873
Publikováno v:
2019 IEEE National Aerospace and Electronics Conference (NAECON).
A simple PUF-based authentication circuit is proposed that will lower the entry barrier for counterfeit countermeasures by COTs manufacturers of integrated circuits. The on-chip fingerprint circuit does not require additional die area, I/O pins, or a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::133de784abc782eff9a9f8aed41561d1
https://doi.org/10.1109/naecon46414.2019.9057840
https://doi.org/10.1109/naecon46414.2019.9057840
Publikováno v:
NAECON 2018 - IEEE National Aerospace and Electronics Conference.
A two-level classification of unauthentic ICs into counterfeits and Trojan-bearing ICs is discussed that separates perpetuators driven by financial incentives from those driven by a disruptive payload goal. A method is discussed for practically intro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f909e4abf967719f8690d128477ecfcb
https://doi.org/10.1109/naecon.2018.8556764
https://doi.org/10.1109/naecon.2018.8556764