Zobrazeno 1 - 10
of 133
pro vyhledávání: '"Raman, Shivakumar"'
Metrology, the science of measurement, plays a key role in Advanced Manufacturing (AM) to ensure quality control, process optimization, and predictive maintenance. However, it has often been overlooked in AM domains due to the current focus on automa
Externí odkaz:
http://arxiv.org/abs/2411.05286
Over the years, Digital Twin (DT) has become popular in Advanced Manufacturing (AM) due to its ability to improve production efficiency and quality. By creating virtual replicas of physical assets, DTs help in real-time monitoring, develop predictive
Externí odkaz:
http://arxiv.org/abs/2411.01299
Digital Twins (DTs) are becoming popular in Additive Manufacturing (AM) due to their ability to create virtual replicas of physical components of AM machines, which helps in real-time production monitoring. Advanced techniques such as Machine Learnin
Externí odkaz:
http://arxiv.org/abs/2409.00877
Diffusion Models are probabilistic models that create realistic samples by simulating the diffusion process, gradually adding and removing noise from data. These models have gained popularity in domains such as image processing, speech synthesis, and
Externí odkaz:
http://arxiv.org/abs/2408.10207
Autor:
Ali, Md Shahin, Ahsan, Md Manjurul, Tasnim, Lamia, Afrin, Sadia, Biswas, Koushik, Hossain, Md Maruf, Ahmed, Md Mahfuz, Hashan, Ronok, Islam, Md Khairul, Raman, Shivakumar
Data privacy has become a major concern in healthcare due to the increasing digitization of medical records and data-driven medical research. Protecting sensitive patient information from breaches and unauthorized access is critical, as such incident
Externí odkaz:
http://arxiv.org/abs/2405.13832
Additive manufacturing (AM), particularly 3D printing, has revolutionized the production of complex structures across various industries. However, ensuring quality and detecting defects in 3D-printed objects remain significant challenges. This study
Externí odkaz:
http://arxiv.org/abs/2404.17015
Additive manufacturing (AM) is gaining attention across various industries like healthcare, aerospace, and automotive. However, identifying defects early in the AM process can reduce production costs and improve productivity - a key challenge. This s
Externí odkaz:
http://arxiv.org/abs/2310.08645
Class imbalanced problems (CIP) are one of the potential challenges in developing unbiased Machine Learning (ML) models for predictions. CIP occurs when data samples are not equally distributed between the two or multiple classes. Borderline-Syntheti
Externí odkaz:
http://arxiv.org/abs/2305.09777
Autor:
Nayem, Jannatul, Hasan, Sayed Sahriar, Amina, Noshin, Das, Bristy, Ali, Md Shahin, Ahsan, Md Manjurul, Raman, Shivakumar
Deep learning becomes an elevated context regarding disposing of many machine learning tasks and has shown a breakthrough upliftment to extract features from unstructured data. Though this flourishing context is developing in the medical image proces
Externí odkaz:
http://arxiv.org/abs/2305.04401
Over the years, the Invariant Scattering Transform (IST) technique has become popular for medical image analysis, including using wavelet transform computation using Convolutional Neural Networks (CNN) to capture patterns' scale and orientation in th
Externí odkaz:
http://arxiv.org/abs/2304.10582