Zobrazeno 1 - 10
of 47
pro vyhledávání: '"Ramachandran, Vijay"'
Autor:
Kao, Ming-Yang, Ramachandran, Vijay
Publikováno v:
Algorithms and Computation, 12th International Symposium, ISAAC 2001 Proceedings. Springer LNCS 2223 (2001): 429-440
We propose a mathematical model of DNA self-assembly using 2D tiles to form 3D nanostructures. This is the first work to combine studies in self-assembly and nanotechnology in 3D, just as Rothemund and Winfree did in the 2D case. Our model is a more
Externí odkaz:
http://arxiv.org/abs/cs/0112009
Autor:
Jain Vaibhav, Ramachandran Vijay, Garg Rachana, Pal Sujoy, Gamanagatti Shivanand, Srivastava Deep
Publikováno v:
The Saudi Journal of Gastroenterology, Vol 16, Iss 2, Pp 116-119 (2010)
Hemangioma is the most common benign tumor of liver and is often asymptomatic. Spontaneous rupture is rare but has a catastrophic outcome if not promptly managed. Emergent hepatic resection has been the treatment of choice but has high operative mort
Externí odkaz:
https://doaj.org/article/2d252ef448bd477c8612ff841944314d
Publikováno v:
Journal of Business & Educational Leadership; Summer2022, Vol. 12 Issue 1, p68-80, 13p
Publikováno v:
Global Journal of Business Disciplines; 2021, Vol. 5 Issue 1, p60-69, 10p
Autor:
Feigenbaum, Joan1 joan.feigenbaum@yale.edu, Ramachandran, Vijay2 vramachandran@colgate.edu, Schapira, Michael3 ms7@cs.princeton.edu
Publikováno v:
Distributed Computing. Apr2011, Vol. 23 Issue 5/6, p301-319. 19p. 5 Diagrams, 1 Chart.
Autor:
Le Denmat, Jean-Christophe, Tetar, Laurent, Fanton, Pierre, Yesilada, Emek, Goirand, Pierre-Jerome, Narasimhan, Narayani, Parisi, Paolo, Ramachandran, Vijay, Kekare, Sagar A.
Publikováno v:
2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC); 2015, p146-149, 4p
Autor:
Falodia, Sushil, Garg, Pramod K., Bhatia, Vikram, Ramachandran, Vijay, Dash, Nihar Ranjan, Srivastava, Deep N.
Publikováno v:
In Gastrointestinal Endoscopy 2008 68(2):389-391
Publikováno v:
Business Journal for Entrepreneurs; 2015, Vol. 2015 Issue 1, p108-126, 19p
Publikováno v:
Proceedings of the ACM SIGMETRICS International Conference Measurement & Modeling of Computer Systems; 6/17/2013, p105-116, 12p