Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Rajeswari Kolagani"'
Publikováno v:
AIP Advances, Vol 11, Iss 4, Pp 045124-045124-5 (2021)
We report our studies of the thickness dependence of electrical resistivity and lattice constants in strained epitaxial thin films of calcium manganese oxide. Our results indicate the potential of bi-axial lattice mismatch strain as a handle for modu
Externí odkaz:
https://doaj.org/article/ebce78722b2549ceb3c90616b9b2e8e1
Autor:
Vinay Sharma, Rajeev Nepal, Weipeng Wu, E. A. Pogue, Ravinder Kumar, Rajeswari Kolagani, Lars Gundlach, M. Benjamin Jungfleisch, Ramesh C. Budhani
Publikováno v:
Applied Physics Letters. 122:072403
Spin-to-charge conversion (S2CC) processes in thin-film heterostructures have attracted much attention in recent years. Here, we describe the S2CC in a 3D topological insulator Bi2Te3 interfaced with an epitaxial film of Fe75Co25. The quantification
Publikováno v:
AIP Advances, Vol 11, Iss 4, Pp 045124-045124-5 (2021)
We report our studies of the thickness dependence of electrical resistivity and lattice constants in strained epitaxial thin films of calcium manganese oxide. Our results indicate the potential of bi-axial lattice mismatch strain as a handle for modu
Autor:
Parul Srivastava, Grace Yong, M. Mumtaz Qazilbash, T. J. Huffman, Rajeswari Kolagani, Peng Xu, Vera N. Smolyaninova, T. Goehringer, N.C. Branagan
Publikováno v:
Philosophical Magazine. 95:2078-2091
Previous infrared studies on the hole-doped manganite La0.67Sr0.33MnO3 (LSMO) have analysed its charge dynamics in terms of one type of charge carrier despite evidence of both electron and hole Fermi surfaces. Here, we investigate the charge dynamics
Autor:
Mary Sajini Devadas, Vera N. Smolyaninova, Rajeswari Kolagani, Amy J. Williams, Vonnie D. C. Shields
Publikováno v:
Microscopy and Microanalysis. 24:2334-2335
Autor:
Yong Liang, K.W. Fong, Grace Yong, Rajeswari Kolagani, R. M. Bionta, Stephan Friedrich, E. Ables, Owen B. Drury, C. Gardner
Publikováno v:
IEEE Transactions on Nuclear Science. 56:1114-1120
We are developing cryogenic bolometers to measure the total energy of the Linac Coherent Light Source (LCLS) free electron X-ray laser that is currently being built at the Stanford Linear Accelerator Center. LCLS will produce ultrashort ~ 200 fs X-ra
Autor:
Ekembu Kevin Tanyi, David Schaefer, Christopher Stumpf, Rajeswari Kolagani, Grace Yong, William Vanderlinde
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 34:021601
Atomic force microscope (AFM) induced nanolithography has been successfully utilized on perovskite manganite thin films by several groups to create nanoscale patterns for various fundamental mesoscopic-scale transport studies. However, the chemical a
Autor:
R. Kennedy, Vera N. Smolyaninova, L. Aldaco, E. Talanova, M. Overby, Khim Karki, Rajeswari Kolagani, Grace Yong
Publikováno v:
Physical Review B. 76
In this paper, we report a study of photoinduced and current-induced resistivity changes in ${\mathrm{Bi}}_{0.4}{\mathrm{Ca}}_{0.6}\mathrm{Mn}{\mathrm{O}}_{3}$ thin films. The photoinduced effects were investigated using both far-field and near-field
Autor:
K. Wall, E. Talanova, R. Kennedy, Rajeswari Kolagani, Vera N. Smolyaninova, M. Steger, Grace Yong
Publikováno v:
2007 Quantum Electronics and Laser Science Conference.
Considerable increase of the photoinduced resistivity changes was found in Bi0.4Ca0.6MnO3 thin films after depositing gold nanoparticles on the surface due to resonant enhancement of local electromagnetic field in the vicinity of the gold nanoparticl
Autor:
David Schaefer, Bonnie Ludka, Rajeswari Kolagani, Kyle Hall, Cameron Bolling, Tyler Bradley, Matthew Sneider, John Sunderland, Anthony Davidson Iii
Publikováno v:
MRS Proceedings. 928
Reproducible nanoscale surface lithography have been produced on La00.66Ba0.33MnO3 thin films using Atomic Force Microscopy. Using an anodic oxidation technique, structures were produced using both positive tip bias voltages as well as negative tip v