Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Rajeewa Kumar Jaisawal"'
Publikováno v:
IEEE Transactions on Electron Devices. 70:1970-1976
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d48bc8244a429277aa94e51601708a9f
https://doi.org/10.1109/ted.2023.3241884
https://doi.org/10.1109/ted.2023.3241884
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 22:396-402
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b42f6095655a129827843f1edb6fd75f
https://doi.org/10.1109/tdmr.2022.3181672
https://doi.org/10.1109/tdmr.2022.3181672
Autor:
Saheli Sarkhel, Sunil Rathore, Priyanka Saha, Ankit Dixit, Taha Saquib, Rajeewa Kumar Jaisawal, P.N Kondekar, Navjeet Bagga
Publikováno v:
2023 IEEE Devices for Integrated Circuit (DevIC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d229f4c22ca177f9ad816f1d7e4b471e
https://doi.org/10.1109/devic57758.2023.10134885
https://doi.org/10.1109/devic57758.2023.10134885
Autor:
Mallikarjun Patil, Rajeewa Kumar Jaisawal, Shashank Banchhor, Navneet Gandhi, Navjeet Bagga, Sunil Rathore, P. N. Kondekar
Publikováno v:
2023 IEEE Devices for Integrated Circuit (DevIC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9ea9b2eb8bb5d26255d235cc9b5b94e
https://doi.org/10.1109/devic57758.2023.10134965
https://doi.org/10.1109/devic57758.2023.10134965
Autor:
Rajeewa Kumar Jaisawal, Sunil Rathore, Navneet Gandhi, P. N. Kondekar, Shashank Banchhor, V Bharath Sreenivas, Young Suh Song, Navjeet Bagga
Publikováno v:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51dcd5db8284ae47dac28fee93b4c310
https://doi.org/10.1109/edtm55494.2023.10103127
https://doi.org/10.1109/edtm55494.2023.10103127
Autor:
Navneet Gandhi, Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Shashank Banchhor, Navjeet Bagga
Publikováno v:
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3092ef01a5af7d1e88c5bc16d7cdf859
https://doi.org/10.1109/edtm55494.2023.10103028
https://doi.org/10.1109/edtm55494.2023.10103028
Autor:
Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::357473c340f6de53c3923457bdf4d76a
https://doi.org/10.1109/irps48203.2023.10117918
https://doi.org/10.1109/irps48203.2023.10117918
Device Design Aware and Interface Thermal Resistance Assisted Self-Heating Analysis in Nanosheet FET
Autor:
Sunil Rathore, Shashank Kumar Banchhor, Rajeewa Kumar Jaisawal, Ankit Dixit, Pravin Kondekar, Navjeet Bagga
Publikováno v:
2022 IEEE International Conference on Emerging Electronics (ICEE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41be805be3e0eb5d0c1e9dff0eea8c9f
https://doi.org/10.1109/icee56203.2022.10117683
https://doi.org/10.1109/icee56203.2022.10117683
Autor:
Rajeewa Kumar Jaisawal, Sunil Rathore, Pravin N. Kondekar, Shashank Kumar Banchhor, Navjeet Bagga
Publikováno v:
2022 IEEE International Conference on Emerging Electronics (ICEE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f1f278001cb8f74c179f3eeb451e126
https://doi.org/10.1109/icee56203.2022.10117984
https://doi.org/10.1109/icee56203.2022.10117984
Autor:
SAMEER YADAV, PN Kondekar, Bhaskar Awadhiya, Pranshoo Upadhyay, Rajeewa Kumar Jaisawal, Sunil Rathore
In this paper, a detailed evaluation of negative capacitance FinFET (NC-FinFET) based volatile static random access memory (6T-NCSRAM) is carried out by utilizing L-K equation for ferroelectric and calibrated BSIM-CMG model with 14nm conventional Fin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e01de7f0a2446f5733e99c4b1dc4800f
https://doi.org/10.21203/rs.3.rs-1593256/v1
https://doi.org/10.21203/rs.3.rs-1593256/v1
