Zobrazeno 1 - 10
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pro vyhledávání: '"Rajeev Narayanan"'
Autor:
Rajeev Narayanan, Joseph W. Ligman, Stephen Heisig, Vittorio Caggiano, Gaddi Blumrosen, Stanislav Lukashov, Katsuyuki Sakuma, Avner Abrami
Publikováno v:
Scientific Reports, Vol 8, Iss 1, Pp 1-11 (2018)
Scientific Reports
Scientific Reports
The dynamics of the human fingertip enable haptic sensing and the ability to manipulate objects in the environment. Here we describe a wearable strain sensor, associated electronics, and software to detect and interpret the kinematics of deformation
Akademický článek
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Autor:
John U. Knickerbocker, Katsuyuki Sakuma, Stephen Heisig, Bucknell C. Webb, Rajeev Narayanan, Jeffrey Rogers, Avner Abrami
Publikováno v:
2019 IEEE 69th Electronic Components and Technology Conference (ECTC).
This paper describes the sensor, electronics, software, modeling, and characterization of a fingernail-mounted RF-connected wearable strain sensor system that measures nail deformation from finger movement. Applications to health monitoring and human
Autor:
Li-Wen Hung, Bo Wen, Evan G. Colgan, Russell A. Budd, John U. Knickerbocker, Shriya Kumar, Rajeev Narayanan, Jae-Woong Nah, Qianwen Chen, Minhua Lu, Katsuyuki Sakuma, Siu Vince, B. Dang, Kang-Wook Lee
Publikováno v:
2018 IEEE 68th Electronic Components and Technology Conference (ECTC).
Innovations in healthcare, diagnostics, sensors and data analysis with Artificial Intelligence (AI) learning / recommendations offer opportunities for improved personalized healthcare, lower costs and benefits to the medical industry. The age of pers
Publikováno v:
Optometric Education; Fall2023, Vol. 49 Issue 1, p17-18, 2p
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 21:1811-1822
Noise and process variation present a practical limit on the performance of analog circuits. This paper proposes a methodology for modeling and verification of analog designs in the presence of shot noise, thermal noise, and process variations. The i
Publikováno v:
Journal of Electronic Testing. 26:97-109
Today's analog/RF design and verification face significant challenges due to circuit complexity, process variations and short market windows. In particular, the influence of technology parameters on circuits, and the issues related to noise modeling
Autor:
Huibert D. Mansvelder, Roel de Haan, Brendan Lodder, Rajeev Narayanan, Rhiannon M. Meredith, Martine R. Groen, Lawrence Kalogreades, Zimbo S. R. M. Boudewijns, Minni T. B. McMaster, Christiaan P. J. de Kock
Publikováno v:
Frontiers in Cellular Neuroscience
Frontiers in Cellular Neuroscience, 7:99, 1-10. Frontiers Media S.A.
Boudewijns, Z S R M, Groen, M R, Lodder, B N, McMaster, M T, Kaleogrades, L, de Haan, R, Narayanan, R T, Meredith, R M, Mansvelder, H D & de Kock, C P J 2013, ' Layer-specific high-frequency action potential spiking in the prefrontal cortex of awake rats ', Frontiers in Cellular Neuroscience, vol. 7, 99, pp. 1-10 . https://doi.org/10.3389/fncel.2013.00099
Frontiers in Cellular Neuroscience; Vol 7
Frontiers in Cellular Neuroscience, 7:99, 1-10. Frontiers Media S.A.
Boudewijns, Z S R M, Groen, M R, Lodder, B N, McMaster, M T, Kaleogrades, L, de Haan, R, Narayanan, R T, Meredith, R M, Mansvelder, H D & de Kock, C P J 2013, ' Layer-specific high-frequency action potential spiking in the prefrontal cortex of awake rats ', Frontiers in Cellular Neuroscience, vol. 7, 99, pp. 1-10 . https://doi.org/10.3389/fncel.2013.00099
Frontiers in Cellular Neuroscience; Vol 7
Cortical pyramidal neurons show irregular in vivo action potential (AP) spiking with high frequency bursts occurring on sparse background activity. Somatic APs can backpropagate from soma into basal and apical dendrites and locally generate dendritic
Publikováno v:
NEWCAS
This paper relies on the longest closest subsequence (LCSS), a variant of the longest common subsequence (LCS), to account for process variation and mismatch in analog circuits. At circuit level, the effect of mismatch and process variation that resu
Publikováno v:
DATE
Scopus-Elsevier
Scopus-Elsevier
This paper relies on the longest closest subsequence (LCSS), a variant of the longest common subsequence (LCS), to account for noise and process variations inherited by analog circuits. The idea is to use stochastic differential equations (SDE) to mo