Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Rajagopal, Narayanan"'
Autor:
Rajagopal, Narayanan
The need for high-density power electronics converters becomes more critical by the day as energy consumption continues to grow across the world. Specifically, the need for medium-voltage (MV) high-density converters in power distribution systems, el
Externí odkaz:
http://hdl.handle.net/10919/104148
Publikováno v:
2023 9th International Conference on Advanced Computing and Communication Systems (ICACCS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::687c537222973c57929f76bbf0ae93a5
https://doi.org/10.1109/icaccs57279.2023.10112817
https://doi.org/10.1109/icaccs57279.2023.10112817
Publikováno v:
Methods in Actinobacteriology ISBN: 9781071617274
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cab79cdb052508c69e4264c800ff125d
https://doi.org/10.1007/978-1-0716-1728-1_32
https://doi.org/10.1007/978-1-0716-1728-1_32
Autor:
Leo Kim, Yuri Y. Masuoka, Paul Ivan Penzes, Giri Nallapati, Ying Chen, Venu Boynapalli, S. C. Song, Jason Cheng, Lixin Ge, Sung-Won Kim, Chidi Chidambaram, Rajagopal Narayanan, Xiao-Yong Wang, Jihong Choi, Ukjin Roh, Jerry Bao, Hyejun Jin, Byungmoo Song, Deepak Sharma, Gary Chen, Ming Cai, Zhimin Song, Jie Deng, Jin-Kyu Lee, Vicki Lin, Hao Wang, Kwon Lee, Suh Youseok
Publikováno v:
2020 IEEE Symposium on VLSI Technology.
We report on Qualcomm® Snapdragon™ 765 mobile Platform and world's first integrated 5G platform supporting both mmWave and sub-6 using industry-leading 7nm EUV FinFET technology. Snapdragon 765 unites 5G and AI to power select premium-tier experie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b4d7e8ce5ec3791decfa7aff83431a5
https://doi.org/10.1109/vlsitechnology18217.2020.9265074
https://doi.org/10.1109/vlsitechnology18217.2020.9265074
Publikováno v:
2016 IEEE Innovative Smart Grid Technologies - Asia (ISGT-Asia); 2016, p564-569, 6p
Publikováno v:
ISGT 2014; 2014, p1-5, 5p
Publikováno v:
2013 IEEE Innovative Smart Grid Technologies-Asia (ISGT Asia); 2013, p1-5, 5p
Publikováno v:
2012 Annual SRII Global Conference; 1/ 1/2012, p846-849, 4p
Publikováno v:
Optical Engineering. 33:1872
The optical techniques of stress analysis, such as, holography, photoelasticity, and moire, produce results in the form of whole-field fringe patterns representing physical measurements. The accuracy of results will depend on how precisely fringe ord
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1560dfcb380c9a6f167cb272a89f8b19
https://doi.org/10.1117/12.167158
https://doi.org/10.1117/12.167158