Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Rainer P. H. Garten"'
Publikováno v:
Mikrochimica Acta. 125:101-105
The features of a combustion with elementary fluorine for the case of compact SiC ceramics and model substances for boron containing ceramics (H3BO3 and Na2B4O7) were investigated with the aim of their decomposition and analysis. On-line detection of
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 111:115-125
Rutherford backscattering (RBS) measurements, elastic recoil detection analysis (ERDA) and nuclear reaction analysis (NRA) were applied to determine the composition, the thickness and the density of plasma-deposited SiOxNyHz and SiNyHz layers on sili
Autor:
Rainer P. H. Garten, H.W. Werner
Publikováno v:
Analytica Chimica Acta. 297:3-14
Prominent aims and general aspects of the analysis of thin films, interfaces and surfaces are reviewed. The terminology is presented, and a limited sketch displays the major techniques important in this field. Some topical subjects in thin film analy
Publikováno v:
Analytica Chimica Acta. 297:187-195
Depth profiles were taken by x-ray photoelectron spectrometry/Ar-ion sputtering from copper sheets oxidized during 30 min in air at 200 or 300°C, respectively. The data of the depth profiles were subjected to factor analysis in order to determine th
Autor:
Henning Bubert, Rainer P. H. Garten
Publikováno v:
Applied Surface Science. 81:203-214
To improve the accuracy of quantitative AES analysis, matrix effects disturbing the linearity between the intensity of an Auger signal and the atomic concentrations have to be considered. Matrix factors accounting for these effects refer to (1) elect
Autor:
Rainer P. H. Garten
Publikováno v:
Journal of the Chinese Chemical Society. 41:259-274
Selected prominent problems in the analysis of advanced ceramic materials are surveyed. The importance of reliability of results is discussed in the field of elemental trace- and microanalysis in view of its interaction with economy, power of detecti
Publikováno v:
Surface and Interface Analysis. 19:211-216
To prepare a candidate reference material for depth-profiling analysis by AES, XPS, SIMS, SNMS, ISS, RBS, etc., silicon wafers were implanted with cobalt ions at an energy Eo = 300 keV. The total implanted doses, 1012
Publikováno v:
Analytical Chemistry. 64:1100-1105
Reliable quantification of methods for surface and depth profiling analysis depends on the avallability of reference materials for calibrations. Since precision of depth profiling analysis procedures reaches the 1-2% level, the elemental contents in
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 343:778-781
The use of a commercially available AAS graphite tube atomizer as an electrode for the cathodic electrodeposition of element traces at constant-current in a hydrodynamic flow-through-system is described. After deposition the graphite tube is transfer
Quantitative Auger electron spectrometric depth profile analysis of binary alloy reference materials
Autor:
Rainer P. H. Garten, H. Bubert
Publikováno v:
Analytical and Bioanalytical Chemistry. 353:351-353
Using AES/sputtering, the binary alloy systems Ag/Cu, Ni/Cr and Pb/Sb ranging from 0 to 100% have been studied experimentally with respect to the shape of the calibration curve. The signal intensities are modified by the composition of the matrix. A