Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Raian F Kaiser"'
Autor:
Raian F. Kaiser, Dylan F. Williams
Publikováno v:
54th ARFTG Conference Digest.
This paper explores the impact of five sources of systematic error in coplanar-waveguide thru-reflect-line calibrations. We develop expressions that predict systematic measurement error and test them experimentally by deliberately introducing error i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d85ed37e56c749ec8497382a3144d379
https://doi.org/10.1109/arftg.1999.327367
https://doi.org/10.1109/arftg.1999.327367
Publikováno v:
56th ARFTG Conference Digest.
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped sta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::642752992abcf1ffad973dd6b6275d90
https://doi.org/10.1109/arftg.2000.327431
https://doi.org/10.1109/arftg.2000.327431