Výsledky vyhledávání - "Rahul Kesarwani"

Control of trion-to-exciton conversion in monolayer WS 2 by orbital angular momentum of light

Autor: Rahul Kesarwani, Kristan Bryan Simbulan, Teng-De Huang, Yu-Fan Chiang, Nai-Chang Yeh, Yann-Wen Lan, Ting-Hua Lu

Publikováno v: Science Advances. 8

Controlling the density of exciton and trion quasiparticles in monolayer two-dimensional (2D) materials at room temperature by nondestructive techniques is highly desired for the development of future optoelectronic devices. Here, the effects of diff

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b738da64d2b2ddb31fb81f9af044ae25
https://doi.org/10.1126/sciadv.abm0100

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Control of trion-to-exciton conversion in monolayer WS

Autor: Rahul, Kesarwani, Kristan Bryan, Simbulan, Teng-De, Huang, Yu-Fan, Chiang, Nai-Chang, Yeh, Yann-Wen, Lan, Ting-Hua, Lu

Publikováno v: Science advances. 8(13)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::c0264f166d54cd8f818935a642a949ba
https://pubmed.ncbi.nlm.nih.gov/35363526

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Phonon polarization deformation in graphene induced by substrate coupling strengths

Autor: Yu-Chen Chang, Bipul Das, Yu-Fan Chiang, Wen-Hao Chang, Yen-Chun Chen, Rahul Kesarwani, Wen-Cheng Ke, Yann-Wen Lan, Ting-Hua Lu

Publikováno v: Applied Physics Letters. 122:032201

Displacement in the Raman shift of conventional Raman spectroscopy usually includes an increase in the number of material layers or a strain variation. To distinguish them, polarization-resolved Raman spectroscopy provides an additional degree of fre

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e734806d760459497eccef686374b5de
https://doi.org/10.1063/5.0122959

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Experimental demonstration of in situ surface and thickness profile measurements of thin film during deposition using a grating array based wavefront sensor

Autor: Nagendra Kumar, Biswajit Pathak, Rahul Kesarwani, Sumit Goswami, Alika Khare, Bosanta R. Boruah

Publikováno v: Optics Letters. 47:5509

Here we introduce an in situ and non-intrusive surface and thickness profile monitoring scheme of thin-film growth during deposition. The scheme is implemented using a programmable grating array based zonal wavefront sensor integrated with a thin-fil

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::006f6ffbc35d844da252a10297795130
https://doi.org/10.1364/ol.471336

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Assessment of interfacial layer thickness of pulsed laser deposited plasmonic copper thin films via spectroscopic ellipsometer

Autor: Rahul Kesarwani, Alika Khare

Publikováno v: Optical Materials. 93:98-102

The thickness of interfacial layer of semitransparent nanostructured plasmonic copper thin films fabricated on the glass substrate via pulsed laser deposition, as a function of deposition time, using spectroscopic ellipsometry is reported. The top ox

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::091099592bd84b320a21af51f1676c2b
https://doi.org/10.1016/j.optmat.2019.05.009

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Correlation between surface scaling behavior and surface plasmon resonance properties of semitransparent nanostructured Cu thin films deposited via PLD

Autor: Alika Khare, Partha Pratim Dey, Rahul Kesarwani

Publikováno v: RSC Advances. 9:7967-7974

The surface scaling behavior of nanostructured Cu thin films, grown on glass substrates by the pulsed laser deposition technique, as a function of the deposition time has been studied using height–height correlation function analysis from atomic fo

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f57ee16946165a60f2b16f071c180775
https://doi.org/10.1039/c9ra00194h

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Efficacy of Raman mapping over ellipsometric spectroscopy and XRD for characterization of structurally heterogeneous PLD nc-Si thin films

Autor: Partha Pratim Dey, Rahul Kesarwani, Alika Khare

Publikováno v: Optical Materials. 84:221-226

The present report demonstrates the efficacy of Raman mapping over X-Ray diffraction (XRD) and spectroscopic ellipsometry (SE) in structural characterization of nanocrystalline Silicon (nc-Si) films having spatial heterogeneity in crystallinity and s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1fd7cec9f5c2ce2f7efb52d4bbeff37d
https://doi.org/10.1016/j.optmat.2018.07.007

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Surface plasmon resonance and nonlinear optical behavior of pulsed laser-deposited semitransparent nanostructured copper thin films

Autor: Alika Khare, Rahul Kesarwani

Publikováno v: Applied Physics B. 124

In this paper, surface plasmon resonance (SPR) and nonlinear optical properties of semitransparent nanostructured copper thin films fabricated on the glass substrate at 400 °C by pulsed laser deposition technique are reported. The thickness, linear

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5629d9844be58209499b94ba25908603
https://doi.org/10.1007/s00340-018-6986-x

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