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Autor:
Rahul Dalia, Francesco Vescio, Gaurav Singh Bisht, Silvio Pierro, Attilio Piacente, Calogero Pace
Publikováno v:
2010 IEEE Instrumentation & Measurement Technology Conference Proceedings.
This work presents an automated measurement system designed and realized in order to perform low-frequency noise measurements on MOSFET devices with the easy of use and programmability of a Source-Measuring Unit (SMU). The designed instrument is made