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pro vyhledávání: '"Rahmat Saptono"'
Autor:
Rahmat Saptono Duryat, Choong-Un Kim
Publikováno v:
Advanced Science Letters. 20:2278-2281
Autor:
Choong-Un Kim, Rahmat Saptono
Publikováno v:
Applied Mechanics and Materials. 534:83-92
A model-inspired phenomenology constitutive equation was developed from the first principles to study the temperature dependence of flow stress at confined dimension. The model was limited in the range of temperature and strain-rate where diffusion i
Autor:
Rahmat Saptono
Publikováno v:
Makara Journal of Technology, Vol 7, Iss 3, Pp 113-118 (2010)
The selection of materials for an engineering component is not only requested by its design function and shape, but also the sequence through which it is manufactured. The manufacturing operation of roller chains involves drawing and trimming process
Autor:
Rahmat Saptono
Publikováno v:
Makara Journal of Technology, Vol 6, Iss 1, Pp 33-35 (2010)
Galvanized steel sheet of 0.8 mm in thickness was drilled with circle holes of 2.5 mm diameter and spacing arranged in tetragonal and hexagonal pattern. The manufacturing properties of specimen were studied through drawing and stretching simulative t
Autor:
Rahmat Saptono Duryat
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 131:012018
Selecting and developing materials for the future devices require a sound understanding of design requirements. Miniaturization of electronic devices, as commonly expressed by Moore Law, has involved the integration level. Increase of the level has c
Autor:
Rahmat Saptono Duryat
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 131:012009
This paper is aimed at evaluating the characteristic and performance of C/C-SiC composites as potential candidate materials for high performance braking system. A set of material specifications had been derived from specific engineering design requir
Temperature-dependence of Threshold Current Density-Length Product in Metallization Lines: A Revisit
Autor:
Rahmat Saptono Duryat, Choong-Un Kim
Publikováno v:
Journal of Physics: Conference Series. 710:012044
One of the important phenomena in Electromigration (EM) is Blech Effect. The existence of Threshold Current Density-Length Product or EM Threshold has such fundamental and technological consequences in the design, manufacture, and testing of electron
Autor:
Duryat, Rahmat Saptono, Kim, Choong-Un
Publikováno v:
IOP Conference Series: Materials Science & Engineering; 2014, Vol. 58 Issue 1, p1-1, 1p