Classification of wood defect images using local binary pattern variants.

Autor: Rahiddin, Rahillda Nadhirah Norizzaty, Hashim, Ummi Raba'ah, Ismail, Nor Haslinda, Salahuddin, Lizawati, Ngo Hea Choona, Zabri, Siti Normi

Publikováno v: International Journal of Advances in Intelligent Informatics; Mar2020, Vol. 6 Issue 1, p36-45, 10p