Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Raghaw Rai"'
Autor:
John Fretwell, Haiyan Tan, Chris Hakala, Timothy A. Johnson, Raghaw Rai, Irene Brooks, Chris Kang, Ahmad Katnani, Laurent Dumas, Yinggang Lu, Weihao Weng, Zhenxin Zhong
Publikováno v:
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Developments in the semiconductor industry are driving the need for new methods to characterize smaller 3D devices in a productive and reproducible way. The automation of sample preparation, TEM imaging, and offline CD metrology is able to provide sa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b91e8d8f026942d1806756a3776c3069
https://doi.org/10.1109/asmc.2018.8373156
https://doi.org/10.1109/asmc.2018.8373156
Publikováno v:
EDFA Technical Articles. 10:20-28
Localizing defects in one-of-a-kind failures can take days, weeks, or even months, after which a detailed physical analysis is conducted to determine the root cause. TEM and STEM play complimentary roles in this process; TEM because of its superior s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6decb320db032ce1191462ebb8a1fe85
https://doi.org/10.31399/asm.edfa.2008-2.p020
https://doi.org/10.31399/asm.edfa.2008-2.p020
Publikováno v:
Microscopy and Microanalysis. 20:1000-1001
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b791db274d1a5fa97a1f5d7ace972850
https://doi.org/10.1017/s1431927614006722
https://doi.org/10.1017/s1431927614006722
Autor:
Leo Mathew, M. Sadd, A. Thean, T. Stephens, R. Mora, M. Zavala, Bichyen Nguyen, Raghaw Rai, Rob Shimer, W. Zang, Murshed M. Chowdhry, Jerry G. Fossum, Y. Du, S. Kalpat, C. Parker, D. Sing, J. Morgab
Publikováno v:
ECS Meeting Abstracts. :563-563
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::159071d54818fb22bff7bbef0101a7a6
https://doi.org/10.1149/ma2005-01/12/563
https://doi.org/10.1149/ma2005-01/12/563
Autor:
Kaupo Kukli, Mikko Ritala, Markku Leskelä, Timo Sajavaara, Juhani Keinonen, David C. Gilmer, Rama Hegde, Raghaw Rai, Lata Prabhu
Publikováno v:
Journal of Materials Science: Materials in Electronics; May2003, Vol. 14 Issue 5-7, p361-367, 7p
Autor:
Kaupo Kukli, Mikko Ritala, Markku Antero Leskelä, Timo Sajavaara, Juhani Keinonen, Gilmer, David C., Rama Hegde, Raghaw Rai, Lata Prabhu
Publikováno v:
University of Helsinki
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a4dca76379cda26976b71f5075f85a00
https://researchportal.helsinki.fi/en/publications/5add46d0-c80b-42e8-90e6-d23f5f08ac10
https://researchportal.helsinki.fi/en/publications/5add46d0-c80b-42e8-90e6-d23f5f08ac10
