Zobrazeno 1 - 1
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pro vyhledávání: '"Raghavendra Rachineni"'
Autor:
Hua-Ling Hsu, Hiromitsu Komai, Minoru Yamashita, Tai-yuan Tseng, Kapil Verma, Yasuyuki Kajitani, Hiroshi Nakamura, Venky Ramachandra, Jang Yong Kang, Pai K. Manjunath, Siddhesh Darne, Noboru Shibata, Jong Yuh, Chang Siau, Heguang Li, Raghavendra Rachineni, Toshiki Hisada, Katsuaki Isobe, Steve Choi, Toru Miwa, Takatoshi Minamoto, Naoya Tokiwa, Naoki Ookuma, Koichiro Hayashi, Alex Yap, Anirudh Amarnath, Susumu Ozawa, Masatoshi Okumura, Swaroop Kulkani, Stanley Jeong, Hitoshi Miwa, Tomoo Hishida, Jason Li, Pradeep Anantula, Masaki Unno, Hardwell Chibvongodze, Kazuaki Kawaguchi, Aki Matsuda, Ohwon Kwon, Masashi Yamaoka, Kwang-Ho Kim, Muralikrishna Balaga, Qui Nguyen, Takuya Ariki, Lei Lin, Anil Pai, Masahito Takehara, Ryo Fukuda, Mitsuyuki Watanabe, Srinivas Rajendra, Seungpil Lee, Yosuke Kato
Publikováno v:
ISSCC
Advancements in 3D-Flash memory-layer-stacking technology has enabled density scaling that circumvents the lithography limitations which have prevented 2D-NAND Flash memory from scaling [1]. Bit densities as high as 5.95Gb/mm2 on a single die were re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::244704105131d64a13561260e586aa32
https://doi.org/10.1109/isscc.2019.8662445
https://doi.org/10.1109/isscc.2019.8662445
