Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Ragava Lokasani"'
Autor:
Takeshi Higashiguchi, Shinichi Namba, Tadashi Hatano, Hiromu Kawasaki, Ragava Lokasani, Michal Zeman, Gerry O'Sullivan, Weihua Jiang, Y. Shimada, Jan Nikl, Jiri Limpouch, Misaki Shoji, Takeo Ejima, Kyoya Anraku
Publikováno v:
Optics express. 27(23)
Our measurement of the soft X-ray emission of Mo plasmas produced by picosecond Nd:YAG lasers emitting on the fundamental (1064 nm, 150 ps) and second (532 nm, 130 ps) harmonics is presented. The contrast in intensity between spectral peaks and the i
Autor:
John Sheil, Jiri Limpouch, Oisin Maguire, L. Maresova, Emma Sokell, J. Proska, G. Joseph, Padraig Dunne, T. McCormack, Gerry O'Sullivan, Ragava Lokasani, Ellie Floyd Barte, Fergal O'Reilly, Domagoj Kos
Publikováno v:
Laser and Particle Beams. 35:574-578
The effects of shape and thickness of a tin surface layer and of the energy of a 170 ps neodymium:yttrium-aluminum-garnet laser pulse on the conversion efficiency (CE) into extreme ultraviolet emission in the 13.5 nm region is investigated. Whereas a
XUV generation from the interaction of pico- and nanosecond laser pulses with nanostructured targets
Autor:
Paul Sheridan, J. Proska, Ragava Lokasani, Domagoj Kos, Jiri Limpouch, Gerry O'Sullivan, Ellie Floyd Barte, Fergal O'Reilly, Oisin Maguire, L. Stolcova, Padraig Dunne, Emma Sokell, T. McCormack
Publikováno v:
X-ray Lasers and Coherent X-ray Sources: Development and Applications.
Laser-produced plasmas are intense sources of XUV radiation that can be suitable for different applications such as extreme ultraviolet lithography, beyond extreme ultraviolet lithography and water window imaging. In particular, much work has focused
Autor:
J. Shiel, Emma Sokell, Bowen Li, Takeshi Higashiguchi, Chihiro Suzuki, Fergal O'Reilly, T. Wu, Elaine Long, G O'Sullivan, Ragava Lokasani, Padraig Dunne, Lingyun Liu, D. Kilbane, T. McCormack
Publikováno v:
AIP Conference Proceedings.
Sources based on laser produced plasmas of tin (Sn) are currently being developed for extreme ultraviolet lithography for semiconductor fabrication. Since they operate at short wavelength (13.5 nm) they are capable of producing features with critical
Autor:
John Sheil, Takeshi Higashiguchi, Ellie Floyd Barte, Chihiro Suzuki, Jiri Limpouch, Gerry O'Sullivan, Padraig Dunne, Toshiki Tamura, Hiroyuki Hara, Ragava Lokasani, Takuya Gisuji
Publikováno v:
Journal of Physics B: Atomic, Molecular and Optical Physics. 51:215001
XUV spectra of 150 ps laser-produced samarium (Sm) plasmas in the 1.8–10 nm wavelength region, where Δn = 1, n = 4 − n = 5 and Δn = 0, n = 4 − n = 4 transitions dominate the observed emission, were investigated experimentally and theoreticall
Autor:
Bowen Li, Takeshi Higashiguchi, Hiroyuki Hara, When Bo Chen, Gerry O'Sullivan, Weihua Jiang, Takuya Gisuji, Chihiro Suzuki, Ragava Lokasani, Ellie Floyd Barte, Tadashi Hatano, Takeo Ejima, Toshiki Tamura, J. Limpouch, Padraig Dunne, Akira Sasaki
Publikováno v:
Journal of Applied Physics. 123:183301
We have characterized the soft x-ray and extreme ultraviolet (XUV) emission of rhodium (Rh) plasmas produced using dual pulse irradiation by 150-ps or 6-ns pre-pulses, followed by a 150-ps main pulse. We have studied the emission enhancement dependen
Autor:
Patrick Hayden, Ragava Lokasani, Gerry O'Sullivan, Paul Sheridan, Akira Endo, Jiri Limpouch, Elaine Long, Fergal O'Reilly, Padraig Dunne
Publikováno v:
SPIE Proceedings.
This paper describes the extreme ultraviolet and soft x-ray emission recorded in the 2-12 nm region from Mo, Ru, Rh and Pd ions present in the laser produced plasmas. The spectra were found to be dominated by 3p-3d transitions in the 5-8 nm region, w
Autor:
Petr Gavrilov, Takeshi Higashiguchi, Jiri Limpouch, Domagoj Kos, Alexandr Jancarek, Gerry O'Sullivan, Michal Nevrkla, Ragava Lokasani, Petr Hribek, Ellie Floyd Barte, Ladislav Pina
Publikováno v:
Journal of Physics B: Atomic, Molecular and Optical Physics. 50:145001
The soft x-ray emission spectra of femtosecond-laser-produced plasmas from 2nd row transition elements from yttrium (Z = 39) to palladium (Z = 46), with the exception of technetium (Z = 43), were measured in the 1–5 nm region. Plasmas were produced
Autor:
Ragava Lokasani, Ivan Pollentier, Roel Gronheid, Thomas B. Lucatorto, Shannon B. Hill, Charles S. Tarrio
Publikováno v:
Extreme Ultraviolet (EUV) Lithography IV.
EUV photoresists are considered as a potential source of optics contamination, since they introduce irradiation induced outgassing in the EUV vacuum environment. Therefore, before these resists can be used on e.g. ASML NXE:3100 or NXE:3300, they need
Autor:
Takeo Ejima, Gerry O'Sullivan, Goki Arai, Bowen Li, Takeshi Higashiguchi, Weihua Jiang, Hiroyuki Hara, Padraig Dunne, Ragava Lokasani, Yoshiki Kondo, Tadashi Hatano, Thanh Hung Dinh, Jiri Limpouch, Tetsuya Makimura
Publikováno v:
Applied Physics Letters. 109:194103
We demonstrate efficient enhancement of soft X-ray (SXR) emission from molybdenum plasmas produced using dual pulse irradiation, in which 10-ns and 150-ps pre-pulses were followed by a 150-ps main pulse. The number of photons was observed to be 5.3