Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Rafik M. Imamov"'
Publikováno v:
Crystallography Reviews. 3:157-226
Physical phenomena characteristic of asymmetric X-ray diffraction schemes for perfect crystals, including diffraction under conditions of specular reflection, have been considered in detail. The principles underlying asymmetric crystal monochromators
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b5336f3c53c9527cf202103d09e2278
https://doi.org/10.1080/08893119208032970
https://doi.org/10.1080/08893119208032970
Autor:
Denis Yu. Prokhorov, Mihael A. Chuev, Stanislav S. Shirokov, G. B. Galiev, Rafik M. Imamov, I. S. Vasil’evskii, V. A. Kulbachinskii, Andrei A. Lomov
Publikováno v:
SPIE Proceedings.
Electron transport, optical and structure properties of the shallow pseudomorphic quantum wells (QW) GaAs/InGaAs/GaAs are studied by electrophysical, photoluminescence and X-ray double-axes diffractometry methods. It is revealed that insertion of a t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::28b5f4b1fb8a36189410dab2eae0bb8f
https://doi.org/10.1117/12.681733
https://doi.org/10.1117/12.681733
Publikováno v:
SPIE Proceedings.
A new device for rapid non-contact characterization of roughness spatial distribution of flat surfaces is developed. Its operational principle is based on the strong dependence on roughness of the intensity of x-rays reflected from a superpolished su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7770cce6baa12b2fd374fec8f521949
https://doi.org/10.1117/12.401657
https://doi.org/10.1117/12.401657
Publikováno v:
SPIE Proceedings.
A new device for rapid non-contact characterization of roughness spatial distribution of flat surfaces is developed. Its operational principle is based on the strong dependence on roughness of the intensity of x-rays reflected from a superpolished su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00fed82607ddb44d425e23e37542025a
https://doi.org/10.1117/12.397955
https://doi.org/10.1117/12.397955
Publikováno v:
SPIE Proceedings.
In the x-ray region, the reflection efficiency ofa superpolished surface strongly depends on its roughness. This effect may beused to obtain a two-dimensional map ofthe roughness spatial distribution for flat surfaces with a rms. roughness height oft
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97d6b1f3c12bc5ca44e8dd178e7a6df5
https://doi.org/10.1117/12.304391
https://doi.org/10.1117/12.304391
Publikováno v:
SPIE Proceedings.
The report is dedicated to the application of grazing-incidence x-ray diffraction in the inclined Bragg-Laue geometry for investigation of semiconductor superlattices (SL). It is shown that it provides depth-resolved information on the SL structure a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf0c1b21d73757dede765f7b78f510fa
https://doi.org/10.1117/12.131045
https://doi.org/10.1117/12.131045
Conference
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Conference
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