Insights into the Effects of RbF-PDT on the Absorber Surface of High Efficiency CIGSe Solar Cells and Development of Analytical and Machine Learning Process Monitoring Methodologies Based on Combinatorial Analysis

Autor: Robert Fonoll-Rubio, Stefan Paetel, Enric Grau-Luque, Ignacio Becerril-Romero, Rafael Mayer, Alejandro Pérez-Rodríguez, Maxim Guc, Victor Izquierdo-Roca

The latest record efficiencies of the Cu(In,Ga)Se2 (CIGSe) photovoltaic technology have been driven by heavy alkali post-deposition treatments (PDTs). Despite their positive effect, especially in the Voc of the devices, their underlying mechanisms ar

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2659::c662f8b49585004804f7a6fafe37d604
https://zenodo.org/record/7683839

A evidenciação de informações contábeis obrigatórias e voluntárias: um estudo em clubes de futebol brasileiros

Autor: Rafael Mayer

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1dcfbf7aa9370733c78d27ab81a86692
https://doi.org/10.37423/200400794

Testing and characterization of challenging optics and optical systems with Shack Hartmann wavefront sensors

Autor: Guillaume Tison, Guillaume Dovillaire, Julie Siv, Rafael Mayer, Rémy Juvénal, Guillaume Beaugrand

Publikováno v: EPJ Web of Conferences, Vol 215, p 06003 (2019)

The Shack-Hartman wavefront sensor is a common metrology tool in the field of laser, adaptive optics and astronomy. However, this technique is still scarcely used in optics and optical system metrology. With the development of manufacturing technique

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ceba3e3aed5f712a0f97a5ab7c05ba7c
https://www.epj-conferences.org/articles/epjconf/pdf/2019/20/epjconf_eos18_06003.pdf

SHARPeR: a non contact 2D profiling instrument at the nanoradian scale (Conference Presentation)

Autor: Rafael Mayer, Guillaume Dovillaire

Publikováno v: Photonic Instrumentation Engineering V.

Synchrotron and Free Electron Laser beamlines new needs require the use of mirrors and gratings with less than 50 nrad rms slope error and less than 1nm height error to reach the diffraction limit at the user wavelength and at the right angle of inci

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::76ea4b441768c8d2021d786a77c6fd56
https://doi.org/10.1117/12.2289882

Coded aperture detector: an image sensor with sub 20-nm pixel resolution

Autor: Patrick P. Naulleau, Nicolas Vannier, Rafael Mayer, Ian Lesser, Ryan Miyakawa, Shifrah Aron-Dine, Antoine Wojdyla

Publikováno v: Miyakawa, Ryan; Mayer, Rafael; Wojdyla, Antoine; Vannier, Nicolas; Lesser, Ian; Aron-Dine, Shifrah; et al.(2014). Coded aperture detector: an image sensor with sub 20-nm pixel resolution. Optics Express, 22(16). Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/88z1q1h1

We describe the coded aperture detector, a novel image sensor based on uniformly redundant arrays (URAs) with customizable pixel size, resolution, and operating photon energy regime. In this sensor, a coded aperture is scanned laterally at the image

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::050fc74c07a6bad6d132a9e543431c2c
https://pubmed.ncbi.nlm.nih.gov/25321062