Zobrazeno 1 - 10
of 126
pro vyhledávání: '"Rafael Castro-Lopez"'
Autor:
Fabio Passos, Nuno Lourenco, Elisenda Roca, Ricardo Martins, Rafael Castro-Lopez, Nuno Horta, Francisco V. Fernandez
Publikováno v:
IEEE Journal of Microwaves, Vol 3, Iss 2, Pp 599-613 (2023)
In this paper, the application of regression-based supervised machine learning (ML) methods to the modeling of integrated inductors and transformers is examined. Different ML techniques are used and compared to improve accuracy. However, it is demons
Externí odkaz:
https://doaj.org/article/987b12fdcb604d82abf71fd3ed7bbaad
Autor:
Antonio Canelas, Fabio Passos, Nuno Lourenco, Ricardo Martins, Elisenda Roca, Rafael Castro-Lopez, Nuno Horta, Francisco V. Fernandez
Publikováno v:
IEEE Access, Vol 9, Pp 124152-124164 (2021)
This paper presents an innovative yield-aware synthesis strategy based on a hierarchical bottom-up methodology that uses a multiobjective evolutionary optimization algorithm to design a complete radiofrequency integrated circuit from the passive comp
Externí odkaz:
https://doaj.org/article/4beafb8c9bb1441cbaffd7b66fb3e467
Autor:
Fabio Passos, Elisenda Roca, Ricardo Martins, Nuno Lourenco, Saiyd Ahyoune, Javier Sieiro, Rafael Castro-Lopez, Nuno Horta, Francisco V. Fernandez
Publikováno v:
IEEE Access, Vol 8, Pp 51601-51609 (2020)
In this paper, physical implementations and measurement results are presented for several Voltage Controlled Oscillators that were designed using a fully-automated, layout- and variability-aware optimization-based methodology. The methodology uses a
Externí odkaz:
https://doaj.org/article/526b293ddb7143e78763106a9e0d7b40
Autor:
Victor M. van Santen, Jose M. Gata-Romero, Juan Nunez, Rafael Castro-Lopez, Elisenda Roca, Hussam Amrouch
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Autor:
Javier Martin-Martinez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodriguez, Rafael Castro-Lopez, Elisenda Roca, Francisco V. Fernandez, Montserrat Nafria
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Autor:
Elisenda Roca, Francisco V. Fernández, Rafael Castro-Lopez, Ricardo Martins, Antonio Canelas, Nuno Horta, Nuno Lourenço, Fábio Passos
Publikováno v:
IEEE Access, Vol 9, Pp 124152-124164 (2021)
Digital.CSIC. Repositorio Institucional del CSIC
instname
idUS. Depósito de Investigación de la Universidad de Sevilla
IEEE Access
Digital.CSIC. Repositorio Institucional del CSIC
instname
idUS. Depósito de Investigación de la Universidad de Sevilla
IEEE Access
This paper presents an innovative yield-aware synthesis strategy based on a hierarchical bottom-up methodology that uses a multiobjective evolutionary optimization algorithm to design a complete radiofrequency integrated circuit from the passive comp
Autor:
Pablo Saraza-Canflanca, Rafael Castro-Lopez, Elisenda Roca, Javier Martin-Martinez, Rosana Rodriguez, Montserrat Nafria, Francisco V. Fernandez
Random Telegraph Noise is a time-dependent variability phenomenon that has gained increased attention during the last years, especially in deeply-scaled technologies. In particular, there is a wide variety of works presenting different techniques des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fec16418b46a3d3ce3448070dc5623eb
http://hdl.handle.net/10261/287738
http://hdl.handle.net/10261/287738
Autor:
Rafael Castro-Lopez, Elisenda Roca, Francisco V. Fernández, Ricardo Martins, Javier Sieiro, Fábio Passos, Nuno Lourenço, Nuno Horta, Saiyd Ahyoune
Publikováno v:
IEEE Access, Vol 8, Pp 51601-51609 (2020)
Digital.CSIC. Repositorio Institucional del CSIC
instname
Digital.CSIC. Repositorio Institucional del CSIC
instname
In this paper, physical implementations and measurement results are presented for several Voltage Controlled Oscillators that were designed using a fully-automated, layout- and variability-aware optimization-based methodology. The methodology uses a
Autor:
Rosana Rodriguez, Elisenda Roca, Javier Martin-Martinez, Rafael Castro-Lopez, Xavier Aragonès, A. Toro-Frias, Diego Mateo, Javier Diaz-Fortuny, P. Saraza-Canflanca, Francisco V. Fernández, P. Martin-Lloret, Enrique Barajas, M. Nafria
Publikováno v:
2021 IEEE Latin America Electron Devices Conference (LAEDC).
Copyright IEEE
The characterization of the MOSFET Time-Dependent Variability (TDV) can be a showstopper for reliability-Aware circuit design in advanced CMOS nodes. In this work, a complete MOSFET characterization flow is presented, in the conte
The characterization of the MOSFET Time-Dependent Variability (TDV) can be a showstopper for reliability-Aware circuit design in advanced CMOS nodes. In this work, a complete MOSFET characterization flow is presented, in the conte
Autor:
Francisco V. Fernández, P. Saraza-Canflanca, Elisenda Roca, Javier Martin-Martinez, Rafael Castro-Lopez, Rosana Rodriguez, G. Pedreira, M. Nafria
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
Digital.CSIC: Repositorio Institucional del CSIC
Consejo Superior de Investigaciones Científicas (CSIC)
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
instname
Digital.CSIC: Repositorio Institucional del CSIC
Consejo Superior de Investigaciones Científicas (CSIC)
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
In nowadays deeply scaled CMOS technologies, time-dependent variability effects have become important concerns for analog and digital circuit design. Transistor parameter shifts caused by Bias Temperature Instability and Random Telegraph Noise phenom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30f04ebd7d2d6afde422336962441a41
https://ddd.uab.cat/record/249450
https://ddd.uab.cat/record/249450