Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Raegan L. Johnson-Wilke"'
Autor:
Collin J. Delker, Raegan L. Johnson-Wilke, Otis M. Solomon, C. Thomas Harris, Ricky L. Sandoval, Sarah R. Stevenson, Christopher D. Nordquist, Mark Harry Ballance
Publikováno v:
IEEE Microwave and Wireless Components Letters. 31:409-412
We report a single broadband on-wafer resistance calibration standard fabricated with a 15-nm-thick gold resistor on an alumina substrate. Because the resistor film is much smaller than the skin depth at microwave frequencies, this proposed standard
Autor:
Joshua Stanford, Stefan Cular, Jason Dominguez, Karl Lukes, Aaron Meyrick, Raegan L. Johnson-Wilke, Edward O'Brien
Publikováno v:
2020 Conference on Precision Electromagnetic Measurements (CPEM).
Multijunction thermal converters are routinely used at many primary standards laboratories for ac voltage measurements and calibrations. After nearly two decades of inactivity, the Primary Standards Laboratory at Sandia National Laboratories has rees
Autor:
Chris M. Fancher, Lyndsey M. Denis, Margeaux Wallace, Jonathon Guerrier, Jacob L. Jones, Carl Morandi, Susan Trolier-McKinstry, Giovanni Esteves, Ryan Keech, Raegan L. Johnson-Wilke
Publikováno v:
Journal of the American Ceramic Society. 100:3961-3972
Autor:
Thanakorn Iamsasri, Jon F. Ihlefeld, Jonathon Guerrier, Chris M. Fancher, Elizabeth A. Paisley, Ralph C. Smith, Alyson G. Wilson, Raegan L. Johnson-Wilke, Jacob L. Jones, Giovanni Esteves, Nazanin Bassiri-Gharb
Publikováno v:
Journal of Applied Crystallography. 50:211-220
A new statistical approach for modeling diffraction profiles is introduced, using Bayesian inference and a Markov chain Monte Carlo (MCMC) algorithm. This method is demonstrated by modeling the degenerate reflections during application of an electric
Autor:
Rudeger H. T. Wilke, Jacob L. Jones, Ronald G. Polcawich, Giovanni Esteves, Margeaux Wallace, Raegan L. Johnson-Wilke, Susan Trolier-McKinstry, Chris M. Fancher
Publikováno v:
Materials & Design, Vol 111, Iss, Pp 429-434 (2016)
Synchrotron X-ray diffraction (XRD) was used to probe the electric-field-induced response of a 500 nm lead zirconate titanate (52/48, Zr/Ti) (PZT) based piezoelectric microelectromechanical system (piezoMEMS) device. 90° ferroelectric/ferroelastic d
Autor:
Raegan L. Johnson-Wilke, Rudeger H. T. Wilke, Chad Hettler, Takashi Murata, Steve Perini, Patrick D. O'Malley, Michael T. Lanagan, Amanda Baker, Harlan James Brown-Shaklee
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 6:1555-1560
Alkali-free glasses, which exhibit high energy storage densities ( $\sim 35$ J/cc), present a unique opportunity to couple high temperature stability with high breakdown strength, and thus provide an avenue for capacitor applications with stringent t
Autor:
Raegan L. Johnson-Wilke, Susan Trolier-McKinstry, Jacob L. Jones, Giovanni Esteves, Rudeger H. T. Wilke, Margeaux Wallace, Chris M. Fancher
Publikováno v:
Journal of the American Ceramic Society. 99:1802-1807
Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}-textured PbZr0.30Ti0.70O3 thin films using synchrotron X-ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain r
Autor:
Raegan L. Johnson-Wilke, Jon F. Ihlefeld, Elizabeth A. Paisley, Susan Trolier-McKinstry, Jong-Woo Kim, Margeaux Wallace, Patrick E. Hopkins, Brian M. Foley, Philip Ryan, John T. Gaskins
Publikováno v:
ACS applied materialsinterfaces. 10(30)
Ferroelastic domain walls in ferroelectric materials possess two properties that are known to affect phonon transport: a change in crystallographic orientation and a lattice strain. Changing populations and spacing of nanoscale-spaced ferroelastic do
Autor:
Raegan L. Johnson-Wilke, Stuart McMuldroch, Daniel A. Schwartz, Vincenzo Cotroneo, Rudeger H. T. Wilke, Susan Trolier-McKinstry, Paul B. Reid
Publikováno v:
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control. 61:1386-1392
The adaptive optics system for the SMARTX telescope consists of piezoelectric PbZr 0.52 Ti 0.48 O 3 (PZT) thin films deposited on the backside of the mirror. To achieve sufficient strain response from the piezoelectric films, the substrates chosen ar
Autor:
Paul B. Reid, A. Ames, Raegan L. Johnson-Wilke, Suzanne Romaine, Vincenzo Cotroneo, Rudeger H. T. Wilke, R. Bruni, Thomas Kester, S. Tolier-McKinstry
Publikováno v:
SPIE Proceedings.
Adjustable X-ray optics represent a potential enabling technology for simultaneously achieving large effective area and high angular resolution for future X-ray Astronomy missions. The adjustable optics employ a bimorph mirror composed of a thin (1.5