Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Radoslav Rusanov"'
Autor:
Oliver Kraft, Tino Fuchs, Juergen Graf, Roland Mueller-Fiedler, Radoslav Rusanov, Holger Rank
Publikováno v:
Microelectronics Reliability. 55:1920-1925
In this work, failure mechanisms of Pt electrodes including adhesion problems, material migration due to thermally induced compressive stress and electromigration that could occur in the platinum electrodes and heater structures at temperatures above
Publikováno v:
Microsystem Technologies. 22:481-493
In this work we present a systematic investigation of various failure mechanisms for thin-film platinum heater structures and interdigitated electrodes as components of a resistive type soot particle sensor. We study the role of stress-migration and
Publikováno v:
2016 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP).
In this work we present a systematic characterization of the mechanical properties of thin-film silicon carbide electrodes and released structures as components of a μ-contact type combustion pressure sensor. We developed, fabricated and successfull
Autor:
Radoslav Rusanov, Roland Mueller-Fiedler, Tino Fuchs, Holger Rank, Juergen Graf, Oliver Kraft
Publikováno v:
2014 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP).
In this work we present a systematic investigation of failure mechanisms for thin-film platinum heater structures and interdigitated electrodes as components of a resistive type soot particle sensor. We study stress-migration and electromigration and
Autor:
Tino Fuchs, D. Leisen, F. Rohlfing, H. Riesch-Oppermann, C. Eberl, Oliver Kraft, Radoslav Rusanov
Publikováno v:
Review of Scientific Instruments. 86:055104
A novel high-temperature micro-tensile setup allows the characterization of the elastic and plastic as well as creep behavior of free-standing thin films at temperatures of up to 1000 °C. Correspondingly, a new layout for free-standing thin film ten