Zobrazeno 1 - 10
of 2 832
pro vyhledávání: '"Radiation failure"'
Autor:
Sobhani, Sina1 (AUTHOR) ssobhani@usc.edu, Dadabhoy, Anosh1 (AUTHOR), Ghoreifi, Alireza1 (AUTHOR), Lebastchi, Amir H.1 (AUTHOR) amir.lebastchi@med.usc.edu
Publikováno v:
Current Oncology. Jul2024, Vol. 31 Issue 7, p3669-3681. 13p.
Publikováno v:
Current Oncology, Vol 31, Iss 7, Pp 3669-3681 (2024)
For patients diagnosed with localized prostate cancer, there are multiple treatment options available. The traditional treatment modalities include radical prostatectomy and radiotherapy. Nevertheless, focal therapy, including high-intensity focused
Externí odkaz:
https://doaj.org/article/28ec852a1f4f486ab23eeb1a18e9f71c
Akademický článek
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Autor:
Bellige, Akash R. (AUTHOR), Tandon, Sarthak (AUTHOR), Purohit, Sandeep (AUTHOR), Akhter, Shamima (AUTHOR), Gairola, Munish (AUTHOR), Ahlawat, Parveen (AUTHOR)
Publikováno v:
Radiotherapy & Oncology. 2024 Supplement 1, Vol. 194, pS1192-S1195. 4p.
Autor:
Siddharth Sheth, Douglas R. Farquhar, Travis P. Schrank, Wesley Stepp, Angela Mazul, Michele Hayward, Nicholas Lenze, Paul Little, Heejoon Jo, M. Ben Major, Bhishamjit S. Chera, Jose P. Zevallos, D. Neil Hayes
Publikováno v:
Laryngoscope Investigative Otolaryngology, Vol 6, Iss 4, Pp 699-707 (2021)
Abstract Objectives Patients with laryngeal squamous cell carcinoma (LSCC) often fail radiation therapy (RT), when received as monotherapy or in combination with other treatment modalities. Mechanisms for RT failure are poorly understood. We hypothes
Externí odkaz:
https://doaj.org/article/d95dfa5806a34d9a9e399fd03e7d518f
Autor:
Sheth, Siddharth1 (AUTHOR) siddharth.sheth@med.unc.edu, Farquhar, Douglas R.2 (AUTHOR), Schrank, Travis P.2,3 (AUTHOR), Stepp, Wesley2 (AUTHOR), Mazul, Angela4 (AUTHOR), Hayward, Michele1 (AUTHOR), Lenze, Nicholas2 (AUTHOR), Little, Paul1 (AUTHOR), Jo, Heejoon5 (AUTHOR), Major, M. Ben3 (AUTHOR), Chera, Bhishamjit S.6 (AUTHOR), Zevallos, Jose P.4 (AUTHOR), Hayes, D. Neil5 (AUTHOR)
Publikováno v:
Laryngoscope Investigative Otolaryngology. Aug2021, Vol. 6 Issue 4, p699-707. 9p.
Autor:
Nair, Shiva Madhwan1, Warner, Andrew2, Lavi, Arnon1, Rodrigues, George2, Chin, Joseph L.1 joseph.chin@lhsc.on.ca
Publikováno v:
Canadian Urological Association Journal. Apr2021, Vol. 15 Issue 4, p123-129. 7p.
Publikováno v:
In Oral Oncology November 2016 62:90-100
Akademický článek
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Autor:
Daniel J. Lichtenwalner, Arthur F. Witulski, John M. Hutson, Robert A. Johnson, Jean-Marie Lauenstein, Andrew L. Sternberg, David Grider, Kenneth F. Galloway, Ronald D. Schrimpf, Robert A. Reed, Robert R. Arslanbekov, Ashok Raman, Dennis R. Ball, Michael L. Alles, Arto Javanainen
Publikováno v:
Materials Science Forum. 1004:1066-1073
Ion-induced leakage current degradation, and single-event burnout may be manifestestations of the same device mechanisms in both silicon carbide power diodes and MOSFETs. In all cases there is a migration of the electrical field from the front body-d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67092943378f179fc05be1d1e8097d95
https://doi.org/10.4028/www.scientific.net/msf.1004.1066
https://doi.org/10.4028/www.scientific.net/msf.1004.1066