Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Rachel V. Zucker"'
Publikováno v:
Scripta Materialia. 116:143-146
The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a powe
Autor:
Andreas Wisnet, Sophia B. Betzler, Rachel V. Zucker, Eiji Okunishi, James A. Dorman, Christina Scheu, Sonja Matich, Peter Wagatha, Lukas Schmidt-Mende
Publikováno v:
Crystal Growth & Design. 14:4658-4663
Crystal defects play a major role in determining the electrical properties of semiconductors. Hydrothermally grown TiO2 rutile nanowire arrays are frequently used as electrodes in photovoltaic devices. However, they exhibit a characteristic defect st
Publikováno v:
Comptes Rendus Physique. 14:564-577
Owing to their extremely aspect ratios, most thin films are unstable and when they are heated, they will dewet or agglomerate to form islands. This process can occur in the solid state through capillary-driven surface self-diffusion. A key feature of
Autor:
Sang Heon Shim, Rachel V. Zucker
Publikováno v:
American Mineralogist. 94:1638-1646
Significantly reduced detection of thermal radiation in gated spectroscopy allowed us to measure the Raman scattering of natural enstatite up to 1550 K at 1 bar. The intrinsic anharmonicity, a i = [(∂ln v i )/(∂ T )] V , of the Raman-active modes
Publikováno v:
Journal of Applied Physics. 119:125306
Dewetting is a well-known degradation mechanism for thin films at elevated temperatures. It is driven by surface energy minimization and occurs while the film is solid. The dewetting process is characterized by the formation of holes, retracting edge
Publikováno v:
Journal of Materials Science
Journal of Materials Science, Springer Verlag, 2012, 47, pp.8290-8302
Journal of Materials Science, 2012, 47, pp.8290-8302
Journal of Materials Science, Springer Verlag, 2012, 47, pp.8290-8302
Journal of Materials Science, 2012, 47, pp.8290-8302
Existing methods to rapidly compute interface-energy minimizing shapes with anisotropy are collected and clarified, and new methods are introduced. A description of freely available, platform-independent software for the computation and display of eq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f349d4493c3455d39c2b77e04473892
https://hal.archives-ouvertes.fr/hal-00773474
https://hal.archives-ouvertes.fr/hal-00773474
Publikováno v:
Journal of Applied Physics. 113:043512
When single crystal thin films undergo solid state dewetting, film edges retract at a rate that is strongly affected by their crystallographic orientations. Lithographically patterned macroscopic edges with a limited number of specific in-plane cryst