Zobrazeno 1 - 10
of 431
pro vyhledávání: '"ROOYACKERS, R"'
Autor:
El Kazzi, S., Smets, Q., Ezzedini, M., Rooyackers, R., Verhulst, A., Douhard, B., Bender, H., Collaert, N., Merckling, C., Heyns, M.M, Thean, A.
Publikováno v:
In Journal of Crystal Growth 15 August 2015 424:62-67
Autor:
Collaert, N., Alian, A., Arimura, H., Boccardi, G., Eneman, G., Franco, J., Ivanov, Ts., Lin, D., Loo, R., Merckling, C., Mitard, J., Pourghaderi, M.A., Rooyackers, R., Sioncke, S., Sun, J.W., Vandooren, A., Veloso, A., Verhulst, A., Waldron, N., Witters, L., Zhou, D., Barla, K., Thean, A.V.-Y.
Publikováno v:
In Microelectronic Engineering 25 January 2015 132:218-225
Autor:
Arstila, K., Hantschel, T., Schulze, A., Vandooren, A., Verhulst, A.S., Rooyackers, R., Eyben, P., Vandervorst, W.
Publikováno v:
In Microelectronic Engineering May 2013 105:99-102
Autor:
Vandooren, A., Leonelli, D., Rooyackers, R., Hikavyy, A., Devriendt, K., Demand, M., Loo, R., Groeseneken, G., Huyghebaert, C.
Publikováno v:
In Solid State Electronics May 2013 83:50-55
Autor:
Schulze, A., Hantschel, T., Eyben, P., Verhulst, A.S., Rooyackers, R., Vandooren, A., Vandervorst, W.
Publikováno v:
In Ultramicroscopy February 2013 125:18-23
Publikováno v:
In Solid State Electronics June 2012 72:82-87
Autor:
Redolfi, A., Kubicek, S., Rooyackers, R., Kim, M.-S., Sleeckx, E., Devriendt, K., Shamiryan, D., Vandeweyer, T., Delande, T., Horiguchi, N., Togo, M., Wouters, J.M.D., Jurczak, M., Hoffmann, T., Cockburn, A., Gravey, V., Diehl, D.L.
Publikováno v:
In Solid State Electronics May 2012 71:106-112
Publikováno v:
In Solid State Electronics November-December 2011 65-66:28-32
Autor:
Kilchytska, V., Alvarado, J., Collaert, N., Rooyackers, R., Put, S., Simoen, E., Claeys, C., Flandre, D.
Publikováno v:
In Solid State Electronics 2011 59(1):18-24
Performance improvement in narrow MuGFETs by gate work function and source/drain implant engineering
Autor:
Ferain, I., Duffy, R., Collaert, N., van Dal, M.J.H., Pawlak, B.J., O’Sullivan, B., Witters, L., Rooyackers, R., Conard, T., Popovici, M., van Elshocht, S., Kaiser, M., Weemaes, R.G.R., Swerts, J., Jurczak, M., Lander, R.J.P., De Meyer, K.
Publikováno v:
In Solid State Electronics 2009 53(7):760-766