RMS Slope of Exponentially Correlated Surface Roughness for Radar Applications.

Autor: Dierking, Wolfgang

Publikováno v: IEEE Transactions on Geoscience & Remote Sensing. May2000, Vol. 38 Issue 3, p1451. 4p. 4 Graphs.

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RMS slope of exponentially correlated surface roughness for radar applications

Autor: W. Dierking

Publikováno v: Dierking, W 2000, ' RMS slope of exponentially correlated surface roughness for radar applications ', I E E E Transactions on Geoscience and Remote Sensing, vol. 38, no. 3, pp. 1451-1454 . https://doi.org/10.1109/36.843040

In radar signature analysis, the root mean square (RMS) surface slope is utilized to assess the relative contribution of multiple scattering effects. For an exponentially correlated surface, an effective RMS slope can be determined by truncating the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dc6a4bb0634debb4980a101f3c863837
https://doi.org/10.1109/36.843040

Elastic Rough Surface Contact and the Root Mean Square Slope of Measured Surfaces over Multiple Scales.

Autor: Jackson, Robert L.¹ jacksr7@auburn.edu, Yang Xu² yang.xu@hfut.edu.cn, Saha, Swarna¹ szs0118@auburn.edu, Schulze, Kyle D.¹ kds0069@auburn.edu

Publikováno v: Fractal & Fractional. Jun2021, Vol. 5 Issue 2, p1-12. 12p.

Improvement of synchrotron radiation mirrors below the 0.1-arcsec rms slope error limit with the help of a long trace profiler

Autor: Marion Berger, Friedmar Senf, Heiner Lammert

Publikováno v: SPIE Proceedings.

Traditional optical manufacturing methods employing both conventional and modem interferometric techniques, enable one to measure surface deviations to high accuracy, e.g. up to ?J100 for flats (6 rim P-V). In synchrotron radiation applications the s

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::56c29ae338c9a905c7cc3cebc277f1a2
https://doi.org/10.1117/12.295556