Study of the Effect of Surface Roughness on the Performance of RF MEMS Capacitive Switches Through 3-D Geometric Modeling

Autor: Sarath Gopalakrishnan, Amitava Dasgupta, Deleep R. Nair

Publikováno v: IEEE Journal of the Electron Devices Society, Vol 4, Iss 6, Pp 451-458 (2016)

Surface roughness is an important factor that influences the reliability and performance of radio frequency microelectromechanical systems switches. The presence of surface roughness impedes a perfect contact in the down-state condition of the switch

Externí odkaz: https://doaj.org/article/f108f7dee83f4022a845dabbf01091d1

Modeling, design, and simulation of a radio frequency microelectromechanical system capacitive shunt switch

Autor: Pedro Anacleto, Bassem Jmai, Ali Gharsallah, Paulo Mendes

Publikováno v: Repositório Científico de Acesso Aberto de Portugal
Repositório Científico de Acesso Aberto de Portugal (RCAAP)
instacron:RCAAP

This tutorial paper presents an empirical model of a capacitive radio frequency microelectromechanical system switch in the microwave domain. The simulation results of the mechanical and electrical aspects of the proposed model were computed with Mat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e06e6346bd46aef1856fd7b01b53fe1b
https://hdl.handle.net/1822/71793

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Fast RF-CV characterization through high-speed 1-port S-parameter measurements

Autor: Peter G. Steeneken, R. W. Herfst, J. Stulemeijer, M. P. J. Tiggelman, Jurriaan Schmitz

Publikováno v: IEEE transactions on semiconductor manufacturing, 25(3), 310-316. IEEE
Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010, 170-173
STARTPAGE=170;ENDPAGE=173;TITLE=Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010

We present a fast radio frequency-capacitance-voltage (RF-CV) method to measure the CV relation of an electronic device. The approach is more accurate, much faster, and more cost effective compared to the existing off-the-shelf solutions. Capacitance

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41b3327ab9465df3462d947211540ff9
https://doi.org/10.1109/icmts.2010.5466829

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.